Zobrazeno 1 - 4
of 4
pro vyhledávání: '"M. A. Moghri Moazzen"'
Publikováno v:
Journal of Nanostructures, Vol 3, Iss 3, Pp 277-280 (2013)
In this research, tellurium (Te) film with thicknesses of 100-250 nm were deposited on ceramic substrates by thermal evaporation at 373 K. The thickness of the film was determined by Rutherford backscattering spectroscopy. The influence of the thickn
Externí odkaz:
https://doaj.org/article/d273bf00f5d34d4cb7e026827a379231
Publikováno v:
Journal of Nanostructures, Vol 2, Iss 3, Pp 295-300 (2012)
ZnO plays an important role in many semiconductors technological aspects. Here, direct precipitation method was employed for the synthesis of nano-sized hexagonal ZnO particles, which is based on chemical reactions between raw materials used in the e
Externí odkaz:
https://doaj.org/article/187f4e3c2377457487fb4af3711519f7
Publikováno v:
Journal of Nanostructures, Vol 2, Iss 1, Pp 107-112 (2012)
Copper thin films with nano-scale structure have numerous applications in modern technology. In this work, Cu thin films with different thicknesses from 50–220 nm have been deposited on glass substrate by DC magnetron sputtering technique at room t
Externí odkaz:
https://doaj.org/article/e8f33b5691374bc9a5cee18b34b129d3
Publikováno v:
Journal of Physics: Conference Series; 2017, Vol. 869 Issue 1, p1-1, 1p