Zobrazeno 1 - 10
of 29
pro vyhledávání: '"M. A. Briere"'
Autor:
Klaus Bethge, D. H. Schneider, Alex V. Hamza, Thomas Schenkel, Horst Schmidt-Böcking, M. A. Briere, A. V. Barnes
Publikováno v:
Physical Review Letters. 79:2030-2033
The loss of kinetic energy of slow $({v\phantom{\rule{0ex}{0ex}}=\phantom{\rule{0ex}{0ex}}0.3v}_{\mathrm{Bohr}})$ ions transmitted through thin carbon foils has been measured as a function of projectile charge state in the range from $q\phantom{\rule
Autor:
M. A. Briere, D. H. Schneider, A. V. Barnes, A.E. Schach von Wittenau, Thomas Schenkel, Alex V. Hamza
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 125:153-158
The emission of secondary electrons and ions from clean Au, CxHyAu and SiO2 surfaces at impact of slow (v ≈ 0.3 vBohr) ions has been measured as a function of incident ion charge for 1 + ≤ q ≤ 75 +. Electron yields from thermal silicon dioxi
Publikováno v:
Physical Review Letters. 78:2481-2484
Charge states of slow (v{approx}0.3v{sub Bohr}) highly charged ions (O{sup 7+}, Ar{sup 16,18+}, Kr{sup 33+}, Th{sup 65+}) have been determined after transmission through 10nm thick amorphous carbon foils. Up to the highest charge states, ions reach c
Autor:
D. H. Schneider, M A Briere
Publikováno v:
Physica Scripta. 53:228-242
Experimental results from a series of investigations, the aim of which is to provide an exploratory overview of the wide range of phenomenon associated with the interaction of slow very highly charged ions with solids and solid surfaces, are reported
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 99:528-531
Radiation induced defects on mica caused by the impact of slow very highly charged ions (SVHCI) have been investigated with an atomic force microscope (AFM). Freshly cleaved surfaces of different types of muscovite were irradiated with SVHCI extracte
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 100:47-54
A single-detector technique for the measurement of negative ion time-of-flight spectra is introduced in this work. Spectra are presented for 390 keV Xe 44f ions at normal incidence on different samples. Mass distributions for C, and Si,O, clusters in
Publikováno v:
Physical Review A. 49:4693-4702
We present total yields for emission of slow (${\mathit{E}}_{\mathit{e}}$\ensuremath{\le}50 eV) electrons due to the impact of slow (${\mathit{v}}_{\mathit{p}}$\ensuremath{\le}5\ifmmode\times\else\texttimes\fi{}${10}^{5}$ m/s) highly charged ions [${
Autor:
D. H. Schneider, C. Rühlicke, G. Weinberg, M. A. Briere, M. Reaves, D.A. Knapp, J. W. McDonald
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 90:231-236
A summary of the present status of the LLNL EBIT based research program on highly charged ion-solid surface interaction is presented. New results for coincidence measurements of K”-KP X-ray emission for Fe 26f incident on Al, using two Ge detectors
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 87:156-161
We found unambiguous evidence of a new radiation effect from the occurrence of single ion defects which are created through the interaction of the Coulombic potential of slow highly charged ions (e.g. Xe 44+ and U 70+ ) and the surface of solid insul
Publikováno v:
Review of Scientific Instruments. 64:3499-3502
We present a new technique for selective, highly sensitive, absolute detection of different multiply charged ion species with equal charge‐to‐mass ratios in mixed multicharged ion beams. This is achieved by exploiting the statistics of potential