Zobrazeno 1 - 10
of 24
pro vyhledávání: '"M. J. Brett"'
Publikováno v:
Journal of Optics A: Pure and Applied Optics. 9:457-462
Tilted columnar biaxial thin films were fabricated by thermally evaporating tris(8-hydroxyquinoline) aluminium (Alq3) at oblique angles of incidence α≥65° measured from the substrate normal. Variable angle spectroscopic ellipsometry and Bruggeman
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f597270443526dfb5078232efe0d0aa8
https://doi.org/10.1088/1464-4258/9/5/006
https://doi.org/10.1088/1464-4258/9/5/006
Autor:
M. J. Brett, D. Vick
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 24:156-164
Electrical conductivity measurements were performed on structurally anisotropic thin films deposited using the glancing angle deposition apparatus [K. Robbie and M. J. Brett, J. Vac. Sci. Technol. A 15, 1460 (1997); K. Robbie, J. Sit, and M. J. Brett
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::98e68d4b9fb6da95d7c654941b99b151
https://doi.org/10.1116/1.2148413
https://doi.org/10.1116/1.2148413
Autor:
M. J. Brett, C. Shafai
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 15:2798-2801
Bismuth telluride films were deposited by coevaporation at various Te/Bi flux ratios to optimize their resistivity and their Seebeck coefficients for use in a thin film Peltier heat pump. Bismuth telluride films deposited at a flux ratio of Te/Bi=2.3
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0ecc7fdd8b0983cc45c392fcb67a55a7
https://doi.org/10.1116/1.580826
https://doi.org/10.1116/1.580826
Publikováno v:
Canadian Metallurgical Quarterly. 34:195-202
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2eb74e75a6835555c37b8f8bd87a1e5b
https://doi.org/10.1179/cmq.1995.34.3.195
https://doi.org/10.1179/cmq.1995.34.3.195
Publikováno v:
2006 IEEE Conference on Emerging Technologies - Nanoelectronics.
Glancing angle deposition (GLAD) was used to grow thin films of silicon and titanium dioxide slanted post nanostructures onto periodically patterned substrates. The patterned substrates consisted of tetragonal arrays of small hillocks with periodicit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::67b52d57e73e35dca1c25528f5b0ba5e
https://doi.org/10.1109/nanoel.2006.1609768
https://doi.org/10.1109/nanoel.2006.1609768
Autor:
Scott R. Kennedy, M. J. Brett
Publikováno v:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 22:1184
Using the glancing angle deposition thin film fabrication technique, it is possible to create tailored, three-dimensional periodic square spiral photonic crystals that exhibit a band of forbidden electromagnetic frequencies related to the dimensions
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b5079d1dba66296567f18575fbf8335d
https://doi.org/10.1116/1.1752903
https://doi.org/10.1116/1.1752903
Autor:
J. N. Broughton, M. J. Brett
Publikováno v:
Electrochemical and Solid-State Letters. 5:A279
Initial characterization of the electrochemical performance of obliquely deposited manganese films with a chevron microstructure, for potential application as electrochemical capacitor materials, has demonstrated that Mn deposited in porous metallic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::015162f7fc96dac59e9c850cd43fe952
https://doi.org/10.1149/1.1516412
https://doi.org/10.1149/1.1516412
Publikováno v:
Electrochemical and Solid-State Letters. 4:C39
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1b38938833cd72d620e0fefa16f6e954
https://doi.org/10.1149/1.1371255
https://doi.org/10.1149/1.1371255
Publikováno v:
Journal of Materials Chemistry; Jan2011, Vol. 21 Issue 4, p1013-1019, 7p
Publikováno v:
Advanced Functional Materials; Jul2006, Vol. 16 Issue 10, p1331-1336, 6p