Zobrazeno 1 - 10
of 16
pro vyhledávání: '"M W Geis"'
A simple micromachining approach to testing nanoscale metal–self-assembled monolayer–metal junctions
Autor:
T M Lyszczarz, M W Geis, T H Fedynyshyn, Michael Switkes, Steven J. Spector, Charles M. Wynn, R R Kunz, Mordechai Rothschild
Publikováno v:
Nanotechnology. 15:86-91
We present a 'flip chip' technique for testing electronic self-assembled monolayers (SAMs). Metal–SAM–metal junctions with contact areas of approximately (25 nm)2 and smaller have been created and tested. While the approach is similar in spirit t
Publikováno v:
Journal of Applied Physics. 77:755-760
A simplified version of the specific contact resistance measurement scheme of G. K. Reeves [Solid State Electronics 23, 487 (1980)] has been developed. Its applicability to semiconducting diamond is demonstrated using four sample types: epitaxial fil
Publikováno v:
Optical Amplifiers and Their Applications/Integrated Photonics Research.
Publikováno v:
Applied Physics Letters. 63:1065-1067
Differential capacitance‐voltage (C‐V) measurements were performed on Al and Pt rectifying contacts fabricated on natural (type IIb) diamonds. The C‐V data showed frequency dependence, which decreased significantly after reducing the back conta
Publikováno v:
Applied Physics Letters. 63:952-954
Schottky diodes formed of Al, Au, and Hg on diamond have been characterized as a function of plasma treatment and thermal annealing. Plasmas formed from N2O, H2, or O2 result in high surface leakage, while plasmas formed from N2 or from CF4 with 8.5%
Autor:
M. W. Geis
Publikováno v:
Diamond and Diamond-like Films and Coatings ISBN: 9781468459692
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::50818fb7db0540d8cc4bf4c745b78f01
https://doi.org/10.1007/978-1-4684-5967-8_54
https://doi.org/10.1007/978-1-4684-5967-8_54
Publikováno v:
Review of Scientific Instruments. 47:306-310
A method for determining the beam overlap integral semiautomatically in a merging beams experiment is presented. The apparatus consists of a driven beam scanner and an analog circuit which computes two‐dimensional overlap integrals from the sampled
Publikováno v:
Journal of Geophysical Research. 81:2231-2236
Absolute electron loss cross sections have been measured for fast hydrogen atoms incident on He, H2, N2, O2, CO, CO2, and CH4 in the 0.25- to 5-keV energy range important in studies of proton aurorae. The fast hydrogen atoms produced by charge transf
Publikováno v:
Journal of Physics E: Scientific Instruments. 8:1011-1014
An inexpensive, sensitive pyroelectric bolometer for use as a fast neutral beam detector is described. Experimentally determined responsivity and noise equivalent power are presented, and are shown to agree with theoretical predictions. The detector
Autor:
M. W. Geis
Publikováno v:
Applied Physics Letters. 55:550-552
A technique has been developed to grow (111) textured diamond films on smooth substrates using attached diamond seeds. The degree of texture is defined by the initial texture of the seeds. This initial texture depends upon the seed size and the clean