Zobrazeno 1 - 10
of 34
pro vyhledávání: '"M Sardela"'
Autor:
Ivan Petrov, Nicola Nedev, I. Bineva, M. Sardela, J. A. N. T. Soares, Richard T. Haasch, E. Manolov, Mario Curiel, B. Sankaran, Benjamin Valdez, D. Nesheva
Publikováno v:
Materials Science and Engineering: B. 174:132-136
X-ray diffraction and reflectivity, X-ray photoelectron spectroscopy and spectroscopic ellipsometry were applied to study the initial composition, thickness, lattice structure and refractive index of ‘fresh’ and annealed thin SiOx films (∼15 nm
Publikováno v:
Journal of Materials Science. 44:5579-5587
Detailed crystallographic data on high-quality Li2MnO3 material has been obtained using a combination of X-ray diffraction (XRD), selected-area electron diffraction (SAED), high-resolution electron microscopy (HREM), and 0.1 nm probe high-angle annul
Publikováno v:
Wear. 267:152-159
Micromechanical properties and microstructural features are highly interrelated and influence the wear performance of composites. In this study, the nanoindentation, X-ray analysis and microstructural SEM tests have been used to reveal the structural
Autor:
Ivan Petrov, Andrey A. Voevodin, M. Sardela, Joseph E Greene, Javier Bareño, Jianguo Wen, Lars Hultman, Brandon M. Howe
Publikováno v:
Surface and Coatings Technology. 202:809-814
Epitaxial metastable Hf 1 − x Al x N alloys with 0 ≤ x ≤ 0.50 were grown on MgO(001) substrates at 600 °C by ultrahigh vacuum reactive magnetron sputtering from Hf and Al targets in 90% Ar + 10% N 2 discharges at 7 mTorr. X-Ray diffraction and
Publikováno v:
Thin Solid Films. 473:41-48
We have determined the average preferred crystalline orientation of thin ultrananocrystalline diamond (UNCD) films using X-ray diffraction. The grain size and lattice parameters of the films were also calculated. We show how these characteristics cha
Autor:
D P Abraham, D W Dees, J Knuth, E Reynolds, R Gerald, Y -E Hyung, I Belharouak, M Stoll, E Sammann, S MacLaren, R Haasch, R Twesten, M Sardela, V Battaglia, E Cairns, J Kerr, M Kerlau, R Kostecki, J Lei, K McCarthy, F McLarnon, J Reimer, T Richardson, P Ross, S Sloop, X Song, V Zhuang, M Balasubramanian, J McBreen, K -Y Chung, X Q Yang, W -S Yoon, L Norin
The Advanced Technology Development (ATD) Program is a multilaboratory effort to assist industrial developers of high-power lithium-ion batteries overcome the barriers of cost, calendar life, abuse tolerance, and low-temperature performance so that t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::042b3b27b52c18c2bf445b0228be1d1d
https://doi.org/10.2172/861617
https://doi.org/10.2172/861617
Autor:
M. Sardela, Joseph E Greene, Ivan Petrov, Can Zhang, Angus Rockett, James N. Eckstein, Brandon M. Howe, Lars Hultman, Antonio B. Mei
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 31:061516
Single-crystal ZrN films, 830 nm thick, are grown on MgO(001) at 450 °C by magnetically unbalanced reactive magnetron sputtering. The combination of high-resolution x-ray diffraction reciprocal lattice maps, high-resolution cross-sectional transmiss
Publikováno v:
Journal of Physics: Conference Series. 113:012027
The characteristics are investigated of high temperature superconducting YBa2Cu3O7 (YBCO) films grown on LaAlO3 (LAO) substrates being exposed a different number of times to YBCO film deposition and acid-solution-based cleaning procedures. Possible m
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