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pro vyhledávání: '"M R, Michaels"'
An interferometric imaging technique can provide time-resolved diagnostics of semiconductor integrated circuits. The semiconductor device is placed in one arm of an interferometer and illuminated with a picosecond pulse from a sub-bandgap infrared la
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::abe58416c84992814cc436e5af080de6
https://doi.org/10.2172/505697
https://doi.org/10.2172/505697
Publikováno v:
Scopus-Elsevier
Summary form only given. An interferometric imaging technique can provide time-resolved diagnostics of semiconductor integrated circuits. The semiconductor device is placed in one arm of an interferometer and illuminated with a picosecond pulse from
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::df85c93cc18f73075839076e21b997c8
https://doi.org/10.1109/ugim.1997.616696
https://doi.org/10.1109/ugim.1997.616696
Publikováno v:
American journal of hospital pharmacy. 47(11)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::8eecc68297b6e95df04c301f60a97562
https://pubmed.ncbi.nlm.nih.gov/2278264
https://pubmed.ncbi.nlm.nih.gov/2278264