Zobrazeno 1 - 10
of 34
pro vyhledávání: '"M N Pisanias"'
Autor:
M. Theodoropoulou, Christoforos A. Krontiras, V. Em. Vamvakas, Stavroula N. Georga, M. N. Pisanias
Publikováno v:
Microelectronics Reliability. 47:834-837
This work is an attempt to estimate the electrical properties of SiO 2 thin films by recording and analyzing their infrared transmission spectra. In order to study a big variety of films having different infrared and electrical properties, we studied
Autor:
Stavroula N. Georga, P. K. Karahaliou, Georgios C. Psarras, M. N. Pisanias, G. Kontos, A. Soulintzis, Christoforos A. Krontiras
Publikováno v:
Express Polymer Letters. 1:781-789
Polymer matrix-TiO2 composites were prepared in three different filler concentrations. The electrical relaxation dynamics as well as the electrical conductivity of all samples were examined by means of Broadband Dielectric Spec- troscopy (BDS) over a
Autor:
M N Pisanias, Nikos Konofaos, Christoforos A. Krontiras, Zhongchun Wang, Stavroula N. Georga, Evangelos Evangelou, J. Sotiropoulos
Publikováno v:
Journal of Electronic Materials. 34:1259-1263
Highly uniform BaTiO3 (BTO) films with thickness well below 100 nm were deposited on p-Si by spin coating using a modified polymeric precursor method. The polymeric precursor gel was redissolved into glacial acetic acid to improve the wetting propert
Autor:
Christoforos A. Krontiras, Androula G. Nassiopoulou, M. Theodoropoulou, M. Kokonou, Stavroula N. Georga, M. N. Pisanias, P. K. Karahaliou
Publikováno v:
Ionics. 11:236-239
The electrical properties of thin porous alumina films in the form of MOS structures were studied with dielectric spectroscopy at room temperature. The thickness of the samples was found to be approximately 95 nm with a cross section area of 1.6×10
Autor:
Stavroula N. Georga, Androula G. Nassiopoulou, Christoforos A. Krontiras, M N Pisanias, P. K. Karahaliou, M. Theodoropoulou, M. Kokonou
Publikováno v:
Journal of Physics: Conference Series. 10:222-225
Impedance Spectroscopy was employed in order to investigate the electrical properties of thin porous anodic alumina films on Si, of thicknesses in the range of 50-200 nm, fabricated by anodization in sulfuric acid. C–V and G–V measurements were p
Autor:
Th K Voilas, M N Pisanias, J. Sotiropoulos, Christoforos A. Krontiras, Nikos Konofaos, Evangelos Evangelou, Zhongchun Wang, Stavroula N. Georga
Publikováno v:
Journal of Physics: Conference Series. 10:49-52
The electrical properties of MOS devices with high-k insulating BaTiO3 sol gel films fabricated onto p-Si substrates, were investigated by a variety of electrical techniques. The aim was to identify the temperature dependence of the electrical proper
Autor:
Stavroula N. Georga, N. Xanthopoulos, M N Pisanias, Christoforos A. Krontiras, Androula G. Nassiopoulou, M. Theodoropoulou, Christos Tsamis, P. K. Karahaliou
Publikováno v:
Journal of Applied Physics. 96:7637-7642
Dielectric impedance measurements as well as transient current–voltage (I–V) characteristics under conditions of forward and reverse bias are reported in aluminum/porous silicon (PS)∕p-cSi structures at different temperatures. Under reverse bia
Autor:
Christoforos A. Krontiras, P. K. Karahaliou, M. Kokonou, Androula G. Nassiopoulou, A. Travlos, Stavroula N. Georga, M. Theodoropoulou, M N Pisanias, N. Xanthopoulos
Publikováno v:
Journal of Applied Physics. 95:2776-2780
Structural characterization and surface topography of porous alumina thin films on silicon with embedded silicon nanocrystals were performed using scanning and transmission electron microscopy. The nature of porous alumina thin films is nanocrystalli
Autor:
M. Theodoropoulou, Androula G. Nassiopoulou, M. N. Pisanias, Stavroula N. Georga, Christos Tsamis, N. Xanthopoulos, Christoforos A. Krontiras
Publikováno v:
Materials Science and Engineering: B. 101:334-337
In order to investigate the prevailing conduction mechanisms of porous silicon (PS) thin films AC impedance spectroscopy measurements, as well as transient current measurements, as a function of voltage, were performed in the temperature range from 1
Autor:
M. Theodoropoulou, Christos Tsamis, Christoforos A. Krontiras, Androula G. Nassiopoulou, M. N. Pisanias, Stavroula N. Georga, N. Xanthopoulos
Publikováno v:
physica status solidi (a). 197:279-283
AC impendance spectroscopy measurements as a function of the applied voltage in the range 0.5 V up to 3 V, as well as measurements of the transient current of porous silicon thin films as function of the applied voltage in the range 1V up to 9 V were