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pro vyhledávání: '"M McElfresh"'
Autor:
Jenessa M. McElfresh
Publikováno v:
Journal of the Medical Library Association, Vol 110, Iss 3 (2022)
Externí odkaz:
https://doaj.org/article/15aeb114420e412cb8b7ede22762ce83
Autor:
Dhruv Shreedhar Kothari, Lauren A. Linker, Tristan Tham, Andrew J. Maroda, Jenessa M. McElfresh, Judd H. Fastenberg, Ralph Abi Hachem, Lucas Elijovich, Lattimore Madison Michael, Sanjeet V. Rangarajan
Publikováno v:
32nd Annual Meeting North American Skull Base Society.
Akademický článek
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Autor:
M. McElfresh, Jean-Jacques Gallet, Maurizio Sacchi, J.-M. Mariot, Coryn F. Hague, Loic Journel
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 246:176-179
Resonant inelastic soft X-ray scattering is a developing technique well suited to the study of correlation effects in complex materials. We briefly describe its potential for materials science and illustrate its sensitivity with a study of elementary
Publikováno v:
Journal of Physics: Condensed Matter. 14:4611-4620
Single crystals of the diluted magnetic semiconductor Cd1-xCoxTe grown by the vertical Bridgman technique are characterized by wavelength-modulated reflectivity and magnetization measurements. Low-temperature magnetization and high-temperature magnet
Autor:
Kristen M. Tucker, Paul M. McElfresh
Publikováno v:
Day 1 Wed, February 26, 2014.
Many of the friction reducers in use today demonstrate various degrees of performance based on the type of mixing water utilized, especially those products which are designed as an "emulsion" (Aften et al. 2009; Zelenev et al. 2009). In addition to m
Autor:
Maeng-Je Seong, A Lewicki, Elżbieta Dynowska, V. Souw, Hussain Alawadhi, I. Miotkowski, S. Miotkowska, M McElfresh, A. K. Ramdas
Publikováno v:
Semiconductor Science and Technology. 16:118-122
Single crystals of Cd1-xCoxTe ternaries, grown by the vertical Bridgman technique, are characterized with x-ray diffraction, electron microprobe analysis, wavelength modulated reflectivity, resonant Raman scattering and magnetization measurements. Th
Publikováno v:
Journal of Micromechanics and Microengineering. 10:483-491
In this paper, the design of silicon based cantilevers for scanning probe microscopy has been described in detail. ANSYS software has been used as a tool to design and model the mechanical properties of the silicon based cantilevers. The incorporatio
Publikováno v:
Journal of Applied Physics. 87:1350-1355
Hall effect and electrical resistivity measurements were carried out on undoped InAs thin films grown by molecular-beam epitaxy directly on (001) GaP substrates. The large lattice mismatch between these two compounds results in a high density array o
Publikováno v:
Journal of Materials Research. 13:2791-2799
Films of Yba2Cu3O7−δ (YBCO) were grown on (001), exact and vicinal (110), and (111) SrTiO3 single crystal substrates by pulsed laser deposition, and evaluated by x-ray diffraction and scanning force microscopy (AFM). It was observed that the YBCO