Zobrazeno 1 - 10
of 23
pro vyhledávání: '"M J Brett"'
Publikováno v:
Journal of Optics A: Pure and Applied Optics. 9:457-462
Tilted columnar biaxial thin films were fabricated by thermally evaporating tris(8-hydroxyquinoline) aluminium (Alq3) at oblique angles of incidence α≥65° measured from the substrate normal. Variable angle spectroscopic ellipsometry and Bruggeman
Autor:
M. J. Brett, D. Vick
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 24:156-164
Electrical conductivity measurements were performed on structurally anisotropic thin films deposited using the glancing angle deposition apparatus [K. Robbie and M. J. Brett, J. Vac. Sci. Technol. A 15, 1460 (1997); K. Robbie, J. Sit, and M. J. Brett
Autor:
M. J. Brett, C. Shafai
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 15:2798-2801
Bismuth telluride films were deposited by coevaporation at various Te/Bi flux ratios to optimize their resistivity and their Seebeck coefficients for use in a thin film Peltier heat pump. Bismuth telluride films deposited at a flux ratio of Te/Bi=2.3
Publikováno v:
Canadian Metallurgical Quarterly. 34:195-202
Publikováno v:
2006 IEEE Conference on Emerging Technologies - Nanoelectronics.
Glancing angle deposition (GLAD) was used to grow thin films of silicon and titanium dioxide slanted post nanostructures onto periodically patterned substrates. The patterned substrates consisted of tetragonal arrays of small hillocks with periodicit
Autor:
Scott R. Kennedy, M. J. Brett
Publikováno v:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 22:1184
Using the glancing angle deposition thin film fabrication technique, it is possible to create tailored, three-dimensional periodic square spiral photonic crystals that exhibit a band of forbidden electromagnetic frequencies related to the dimensions
Autor:
J. N. Broughton, M. J. Brett
Publikováno v:
Electrochemical and Solid-State Letters. 5:A279
Initial characterization of the electrochemical performance of obliquely deposited manganese films with a chevron microstructure, for potential application as electrochemical capacitor materials, has demonstrated that Mn deposited in porous metallic
Publikováno v:
Electrochemical and Solid-State Letters. 4:C39
Publikováno v:
Journal of Materials Chemistry; Jan2011, Vol. 21 Issue 4, p1013-1019, 7p
Publikováno v:
Advanced Materials; Jan2006, Vol. 18 Issue 2, p224-228, 5p