Zobrazeno 1 - 10
of 98
pro vyhledávání: '"M J, Bevan"'
Autor:
Mark R. Visokay, Robert M. Wallace, Manuel Quevedo-Lopez, Luigi Colombo, M. El-Bouanani, M. J. Bevan, Bruce E. Gnade, M. Douglas
Publikováno v:
Journal of Applied Physics. 92:3540-3550
Metal incorporation into silicon substrates, and thermal stability of alternate gate dielectric candidates HfSixOy and ZrSixOy films after aggressive thermal annealing are reported. Considerable Zr incorporation is observed after furnace and rapid th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cba334958c4199558ee59095f5124217
https://doi.org/10.1063/1.1501752
https://doi.org/10.1063/1.1501752
Autor:
Noel Hoilien, Lancy Tsung, Tiezhong Ma, Luigi Colombo, Stephen A. Campbell, M. J. Bevan, Wayne L. Gladfelter, Ryan C. Smith, Jeffrey T. Roberts
Publikováno v:
Advanced Materials for Optics and Electronics. 10:105-114
A brief survey of the precursors used for the chemical vapour deposition of the dioxides of titanium, zirconium and hafnium is presented. The review covers precursors used for the closely related process known as atomic layer chemical vapour depositi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::011128a332a0dc02da16090271053fb6
https://doi.org/10.1002/1099-0712(200005/10)10:3/5<105::aid-amo402>3.0.co
https://doi.org/10.1002/1099-0712(200005/10)10:3/5<105::aid-amo402>3.0.co
Publikováno v:
Journal of Electronic Materials. 28:756-759
The effect of incident angle in spectral ellipsometry (SE) on composition control of Hg1−xCdxTe grown by molecular beam epitaxy (MBE) was investigated. Although a small uncertainty in the incident angle tends to have a significant impact on the ell
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::89443ef486da9c2c9eabcc7d3b1ba404
https://doi.org/10.1007/s11664-999-0066-2
https://doi.org/10.1007/s11664-999-0066-2
Publikováno v:
Journal of Electronic Materials. 27:640-647
Void defects were demonstrated to form away from the substrate-epifilm interface during the molecular beam epitaxial growth of mercury cadmium telluride on cadmium zinc telluride substrates. These were smaller in size compared to voids which nucleate
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1e8f7ba09d5c6ee13ee249ca58b22d25
https://doi.org/10.1007/s11664-998-0028-0
https://doi.org/10.1007/s11664-998-0028-0
Publikováno v:
Journal of Electronic Materials. 26:502-506
A systematic study of the effect of measurement perturbation on in situ monitoring of the composition of molecular beam epitaxially (MBE) grown Hg1−xCdxTe using spectroscopic ellipsometry was carried out. Of the five variables investigated, which i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a5796cafce055f6f3f32819fa5dfbbd9
https://doi.org/10.1007/s11664-997-0184-7
https://doi.org/10.1007/s11664-997-0184-7
Autor:
B T Cookson, M J Bevan
Publikováno v:
The Journal of Immunology. 158:4310-4319
Murine infection with Salmonella typhimurium provides models for typhoid fever and long-lasting protective immunity conferred by oral vaccination with viable attenuated bacteria. To further understand the role of T cells in these systems, we identifi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3a7d19e14c475319fefb75db7546198c
https://doi.org/10.4049/jimmunol.158.9.4310
https://doi.org/10.4049/jimmunol.158.9.4310
Publikováno v:
The Journal of Immunology. 158:3270-3276
Dendritic cells (DC) are potent inducers of CD8+ T cells and can stimulate protective antitumor immunity when pulsed with an antigenic peptide or protein. We used a replication-deficient adenovirus containing a Kb-restricted antigenic peptide of chic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::95dbf18ea99b3a3f19f96a093ff178e4
https://doi.org/10.4049/jimmunol.158.7.3270
https://doi.org/10.4049/jimmunol.158.7.3270
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 15:216-222
Spectral ellipsometry has been applied to in situ diagnostics of Hg1−xCdxTe molecular beam epitaxial growth. Spectral ellipsometry provides surface, composition, and film thickness properties of thin film electronic materials in real-time during gr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7ea1ec48edd01c201181ad321791756c
https://doi.org/10.1116/1.580515
https://doi.org/10.1116/1.580515
Publikováno v:
Journal of Electronic Materials. 25:1375-1382
The operability of long-wavelength p-on-n double layer heterojunction arrays for 40K low-background applications has long been limited by the wide variation in pixel-to-pixel zero bias resistance (Ro) values. Diodes on test structures showing lower p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fbd0cdd5e0ce0bf562d88b41556431a2
https://doi.org/10.1007/bf02655037
https://doi.org/10.1007/bf02655037
Publikováno v:
Journal of Electronic Materials. 25:1371-1374
The current status of the implementation and refinement of two wafer state sensors forin situ monitoring and control during molecular beam epitaxial (MBE) growth of Hg1−xCdxTe will be reported. First a rapid scan spectral ellipsometer has been deve
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::696e99c9d85d1987fbbc9981cd736d8f
https://doi.org/10.1007/bf02655036
https://doi.org/10.1007/bf02655036