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pro vyhledávání: '"M G A van Veghel"'
Publikováno v:
Measurement Science and Technology. 18:390-394
Within the Dutch standards laboratory (NMi Van Swinden Laboratorium) a traceable atomic force microscope (AFM) is currently being developed where we aim at a measurement uncertainty of 1 nm. As part of this development novel methods have been develop
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c318cb638c52306d9da2b745f0fc96d8
https://doi.org/10.1088/0957-0233/18/2/s10
https://doi.org/10.1088/0957-0233/18/2/s10
