Zobrazeno 1 - 8
of 8
pro vyhledávání: '"M G A van Veghel"'
Publikováno v:
Measurement Science and Technology. 18:390-394
Within the Dutch standards laboratory (NMi Van Swinden Laboratorium) a traceable atomic force microscope (AFM) is currently being developed where we aim at a measurement uncertainty of 1 nm. As part of this development novel methods have been develop
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c318cb638c52306d9da2b745f0fc96d8
https://doi.org/10.1088/0957-0233/18/2/s10
https://doi.org/10.1088/0957-0233/18/2/s10
Publikováno v:
Journal of the Physical Society of Japan; 1/15/2022, Vol. 91 Issue 1, p1-5, 5p
Autor:
van den Brom, Helko E., van Leeuwen, Ronald, Marais, Zander, ten Have, Bas, Hartman, Tom, Azpurua, Marco, Pous, Marc, Kok, Gertjan, van Veghel, Marijn, Kolevatov, Ilia, Malmbekk, Helge, Silva, Ferran, Leferink, Frank
Publikováno v:
IEEE Transactions on Electromagnetic Compatibility; Dec2021, Vol. 63 Issue 6, p1865-1874, 10p
Autor:
Cahill, David G., Ford, Wayne K., Goodson, Kenneth E., Mahan, Gerald D., Majumdar, Arun, Maris, Humphrey J., Merlin, Roberto, Phillpot, Simon R.
Publikováno v:
Journal of Applied Physics; 1/15/2003, Vol. 93 Issue 2, p793, 26p, 1 Color Photograph, 2 Black and White Photographs, 3 Diagrams, 2 Charts, 13 Graphs
Publikováno v:
Physica Status Solidi (C); Jun2015, Vol. 12 Issue 6, p560-563, 4p
Publikováno v:
IEEE Transactions on Electromagnetic Compatibility; Dec2021, Vol. 63 Issue 6, p1768-1768, 1p
Publikováno v:
IEEE Transactions on Instrumentation & Measurement; 2021, Vol. 70, pC1-lviii, 1p
Publikováno v:
International Journal of Metrology & Quality Engineering. May2014, Vol. 5 Issue 2, pN.PAG-00. 1p.