Zobrazeno 1 - 10 of 150 pro vyhledávání: '"M El Gomati"'
4
Hallmark of quantum skipping in energy filtered lensless scanning electron microscopy
Autor: A.-K. Thamm, J. Wei, J. Zhou, C. G. H. Walker, H. Cabrera, M. Demydenko, D. Pescia, U. Ramsperger, A. Suri, A. Pratt, S. P. Tear, M. M. El-Gomati
Publikováno v: Applied Physics Letters, 120 (5)
We simulate the electronic system of ejected electrons arising when a tip, positioned few 10 nm away from a surface, is operated in the field emission regime. We find that, by repeated quantum reflections (“quantum skipping”), electrons produced
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0cfda1ac22b27d49097970364066032c
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5
Next generation secondary electron detector with energy analysis capability for SEM
Autor: Mohamed M. El-Gomati, Ashish Suri, S.P. Tear, C. G. H. Walker, Andrew Pratt
Publikováno v: Journal of Microscopy, 279 (3)
Journal of Microscopy
We report the working of a novel detector design based on a Bessel Box (BB) electron energy analyser in a scanning electron microscope (SEM). We demonstrate the application of our detector for elemental identification through Auger electron detection
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4daa4cbd3e2f8ad81f9891f6352f9a41
https://hdl.handle.net/20.500.11850/465894
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6
Analysis and detection of low-energy electrons in scanning electron microscopes using a Bessel box electron energy analyser
Autor: C. G. H. Walker, Cem Kincal, Umut Kamber, Ashish Suri, Oguzhan Gurlu, Andrew Pratt, Mohamed M. El-Gomati, S. P. Tear
Publikováno v: Journal of Electron Spectroscopy and Related Phenomena, 241
The interpretation of images generated by scanning electron microscopes (SEMs) requires quantifiable and well-understood contrast. Furthermore, recent interest in probing samples using low-energy electrons to extract surface information is pushing to
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::57ee1722fa0669976e44c9d83ee31eae
https://hdl.handle.net/20.500.11850/424334
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8
A parallel acquisition charged particle energy analyser using a magnetic field
Autor: M. M. El Gomati, X. Zha, C. G. H. Walker
Publikováno v: Surface and Interface Analysis. 49:34-46
A new form of charged particle energy analyser is proposed. It is broadly based on the 180° magnetic spectrograph, but is intended to detect charged particles moving out of the dispersion plane with a helical motion. The analyser has the capability
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::6af43033b07c5307bc8a52d689134b94
https://doi.org/10.1002/sia.6055
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9
Acquisition of the dopant contrast in semiconductors with slow electrons
Autor: Eliška Mikmeková, Filip Mika, Mohamed M. El-Gomati, Miloš Hovorka, Ilona Müllerová, Ludĕk Frank
Publikováno v: Journal of Electron Spectroscopy and Related Phenomena. 241:146836
Methods available for the mapping of dopants in silicon-based semiconductor structures with p-type as well as n-type doped patterns using low and very-low-energy electrons are reviewed together with the results of demonstration experiments.
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::4d9c899097e778f916978a472ed0ae09
https://doi.org/10.1016/j.elspec.2019.03.004
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