Zobrazeno 1 - 3
of 3
pro vyhledávání: '"M D, Brunsman"'
Autor:
S, Papernov, M D, Brunsman, J B, Oliver, B N, Hoffman, A A, Kozlov, S G, Demos, A, Shvydky, F H M, Cavalcante, L, Yang, C S, Menoni, B, Roshanzadeh, S T P, Boyd, L A, Emmert, W, Rudolph
Publikováno v:
Optics express. 26(13)
Hafnium oxide thin films with varying oxygen content were investigated with the goal of finding the optical signature of oxygen vacancies in the film structure. It was found that a reduction of oxygen content in the film leads to changes in both, str
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::37ae60092fa839e5ed01c164734d711b
https://pubmed.ncbi.nlm.nih.gov/30119572
https://pubmed.ncbi.nlm.nih.gov/30119572
Autor:
A. A. Kozlov, Luke A. Emmert, M D Brunsman, Wolfgang Rudolph, Carmen S. Menoni, Semyon Papernov, James B. Oliver, B. Roshanzadeh, L Yang, A. Shvydky, F H M Cavalcante, Brittany N. Hoffman, Stavros G. Demos, S. T. P. Boyd
Publikováno v:
Optics Express. 26:17608
Hafnium oxide thin films with varying oxygen content were investigated with the goal of finding the optical signature of oxygen vacancies in the film structure. It was found that a reduction of oxygen content in the film leads to changes in both, str
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::772da16d1bcc3930efc950ee4767497c
https://doi.org/10.1364/oe.26.017608
https://doi.org/10.1364/oe.26.017608
Autor:
M. D. Brunsman
Publikováno v:
2010 76th ARFTG Microwave Measurement Conference.
This paper presents a methodology for determining the series resistance of (through-wafer interconnect) Vias directly from measured S-Parameters using an ultra-low impedance measurement known as the “S21-Shunt” technique. Data is acquired followi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5934e8545fb1812b36c8235f8c1cc315
https://doi.org/10.1109/arftg76.2010.5700045
https://doi.org/10.1109/arftg76.2010.5700045