Zobrazeno 1 - 10
of 33
pro vyhledávání: '"M Al Daas"'
Autor:
I Mattig, T Steudel, E Romero Dorta, G Barzen, D Frumkin, N Laule, M Al-Daas, S Spethmann, K Stangl, F Knebel, S Canaan-Kuehl, K Hahn, A Brand
Publikováno v:
European Heart Journal. 43
Background Infiltrative cardiomyopathies such as cardiac amyloidosis (CA) and Fabry disease (FD) are associated with high cardiovascular morbidity and mortality. Diagnosis is often challenging as CA and FD may present similar cardiac phenotypes on st
Autor:
T Steudel, I Mattig, E Romero Dorta, G Barzen, D Frumkin, N Laule, M Al Daas, S Spethmann, F Knebel, S Canaan-Kuhl, K Stangl, K Hahn, A Brand
Publikováno v:
European Heart Journal. 43
Background Left ventricular (LV) wall thickening is a typical echocardiographic finding in infiltrative cardiomyopathies like cardiac amyloidosis (CA) and Fabry disease (FD). The discrimination of both infiltrative diseases remains challenging by sta
Publikováno v:
IEEE Transactions on Electron Devices. 41:288-293
The Curtice quadratic, Materka, Statz, and Rodriguez nonlinear models are compared from DC, CV, and RF points of view, to determine which is the most suitable for nonlinear wideband circuit design. For this comparison, GaAs MESFETs of various sizes a
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 13:1489-1497
A new equation for simulating the bias dependency of the gate-source and gate-drain capacitances of the GaAs MESFET is presented and compared with existing techniques. It provides increased accuracy for microwave circuit design applications and subst
Publikováno v:
Scopus-Elsevier
ISCAS
ISCAS
The Curtice quadratic, Materka, Statz and Rodriguez nonlinear models are compared from DC, constant voltage (CV) and RF points of view in order to determine which is most suitable for nonlinear wideband circuit design. For this comparison, a variety
Publikováno v:
IEEE Transactions on Electron Devices. 40:2083-2085
An empirical equation for simulating the bias dependency of the junction capacitances of the GaAs MESFET is presented and compared with existing techniques. It provides increased accuracy over a wide range of silicon and GaAs devices for microwave ci
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Publikováno v:
IEE Proceedings - Circuits, Devices and Systems. 143:129
Measurements are performed on a variety of GaAs MESFET devices to show that the observed differences between the static and pulsed current/voltage characteristics do not arise entirely from self-heating effects. The results show that a significant re
Publikováno v:
European Journal of Nuclear Medicine & Molecular Imaging. Sep2021 Supplement 1, Vol. 48, p1-648. 648p.
Akademický článek
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