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Publikováno v:
2021 XXXIVth General Assembly and Scientific Symposium of the International Union of Radio Science (URSI GASS).
During the radiated susceptibility test of an equipment, the thermal runaway of a circuit element (TVS diode) is observed. In this work, the case is systematically investigated to understand how this physical hazard has occurred. By modeling and simu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::40305859001bab885bf0cd42e78a8886
https://doi.org/10.23919/ursigass51995.2021.9560233
https://doi.org/10.23919/ursigass51995.2021.9560233
