Zobrazeno 1 - 10
of 15
pro vyhledávání: '"Lutz Muche"'
Publikováno v:
Image Analysis and Stereology, Vol 19, Iss 2, Pp 119-124 (2011)
This paper investigates histological tissues by means of image analysis and spatial statistics. For the quantification of cell frequencies and accumulations two statistical characteristics, intensity function and cluster density, are suggested. The s
Externí odkaz:
https://doaj.org/article/911bb2fa6fb24e57ac7c38a237789bd8
Autor:
Lutz Muche, Lothar Heinrich
Publikováno v:
Applied Mathematical Sciences. 10:1307-1320
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1ecc3acde6f0bf67d12ed451a19ce73a
https://doi.org/10.12988/ams.2016.63105
https://doi.org/10.12988/ams.2016.63105
Autor:
Lutz Muche
Publikováno v:
Advances in Applied Probability. 37:279-296
In a unified approach, this paper presents distributional properties of a Voronoi tessellation generated by a homogeneous Poisson point process in the Euclidean space of arbitrary dimension. Probability density functions and moments are given for cha
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b2b4844aad817dd74baf25d1c0da685f
https://doi.org/10.1239/aap/1118858626
https://doi.org/10.1239/aap/1118858626
Autor:
Lothar Heinrich, Lutz Muche
Publikováno v:
Mathematische Nachrichten. 283:1674-1676
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::877fccb0524f6497f629589afa82eb63
https://doi.org/10.1002/mana.201011999
https://doi.org/10.1002/mana.201011999
Autor:
Lutz Muche
Publikováno v:
Mathematische Nachrichten. 191:247-267
This paper gives distributional properties of geometrical characteristics of a Voronoi tessellation generated by a stationary Poisson point process. The considerations are based on a well-known formula given by [10] describing size and shape of a cel
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::20341e1b08bec60f884723b31e7ff5b8
https://doi.org/10.1002/mana.19981910113
https://doi.org/10.1002/mana.19981910113
Autor:
Lutz Muche
Publikováno v:
Journal of Statistical Physics. 84:147-167
This paper gives distributional properties of geometrical characteristics of the Delaunay tessellation generated by a stationary Poisson point process in ℝ3. The considerations are based on a well-known formula given by Miles which describes the si
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::256650cefbae440d4f2dfc896bbf777e
https://doi.org/10.1007/bf02179580
https://doi.org/10.1007/bf02179580
Autor:
Lutz Muche
Publikováno v:
Mathematische Nachrichten. 178:271-283
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::18d4e609daa5fcf54a631847214fff2c
https://doi.org/10.1002/mana.19961780113
https://doi.org/10.1002/mana.19961780113
Autor:
Lutz Muche, Joseph Mecke
Publikováno v:
Mathematische Nachrichten. 176:199-208
This paper gives basic relations between the stationary Poisson point process and the point process of vertices of the corresponding Voronoi tessellation in IRd and of planar sections through it. The results are based on a study of the Palm distribut
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9fbc808fd17d411b0733735dd2a83999
https://doi.org/10.1002/mana.19951760115
https://doi.org/10.1002/mana.19951760115
Autor:
John M. Nieminen, Lutz Muche
Consider the set of points defined by the intersection of a one-dimensional (random) line and a Voronoi tessellation generated by a two-dimensional homogeneous Poisson point process. We show that the nearest-neighbor and higher-order spacing statisti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cd658448fd1b59aa1fbcfe39c478b562
https://publica.fraunhofer.de/handle/publica/229451
https://publica.fraunhofer.de/handle/publica/229451
Publikováno v:
Process Variations and Probabilistic Integrated Circuit Design ISBN: 9781441966209
This chapter provides a short overview on the basics of CMOS transistor modeling with respect to deep submicron requirements and mathematical approaches to analyze variations in the design process. Technical terms are going to be defined and explaine
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::be1f69027f50b0f844c227cddb415770
https://doi.org/10.1007/978-1-4419-6621-6_2
https://doi.org/10.1007/978-1-4419-6621-6_2