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Publikováno v:
Spectroscopic Characterization Techniques for Semiconductor Technology V.
Semiconductor surfaces develop orientation dependent morphologies during growth that can be used for fabrication of nanostructured materials. We have applied RHEED techniques to study during MBE the nanometer-scale morphologies on non-(001)-oriented
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2c909d4f0d96b71f42278f0cdd61b8db
https://doi.org/10.1117/12.176845
https://doi.org/10.1117/12.176845
