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pro vyhledávání: '"Luschkova, Maria"'
Autor:
Gutierrez, Pierre, Luschkova, Maria, Cordier, Antoine, Shukor, Mustafa, Schappert, Mona, Dahmen, Tim
Deep learning is now the gold standard in computer vision-based quality inspection systems. In order to detect defects, supervised learning is often utilized, but necessitates a large amount of annotated images, which can be costly: collecting, clean
Externí odkaz:
http://arxiv.org/abs/2104.02980
Autor:
Trampert, Patrick, Rubinstein, Dmitri, Boughorbel, Faysal, Schlinkmann, Christian, Luschkova, Maria, Slusallek, Philipp, Dahmen, Tim, Sandfeld, Stefan
The analysis of microscopy images has always been an important yet time consuming process in in materials science. Convolutional Neural Networks (CNNs) have been very successfully used for a number of tasks, such as image segmentation. However, train
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=sharePrprorg::654ae05a1e327c168a579de4f23ae9f6
Autor:
Komuro, Takashi, Shimizu, Tsuyoshi, Gutierrez, Pierre, Luschkova, Maria, Cordier, Antoine, Shukor, Mustafa, Schappert, Mona, Dahmen, Tim
Publikováno v:
Proceedings of SPIE; July 2021, Vol. 11794 Issue: 1 p1179403-1179403-8