Zobrazeno 1 - 10
of 63
pro vyhledávání: '"Lurng-Shehng Lee"'
Publikováno v:
2020 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia).
SiC MOSFET is one of the most popular power devices in some high-end applications. Since SiC MOSFET has already penetrated into many applications, the requirement of accurate SPICE models is a significant issue for circuit designers. From previous li
Autor:
Chih-Fang Huang, Chien-Chung Hung, Jheng-Yi Jiang, Chwan-Ying Lee, Lurng-Shehng Lee, Der-Sheng Chao, Fu-Jen Hsu, Wen-Bin Yeh, Kuo-Ting Chu
Publikováno v:
2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD).
Currently, Schottky diode embedded SiC MOSFETs is a popular topic because of its remarkable intrinsic diode behavior and bipolar-degradation-free operation. JMOS is one of them that exhibits much higher chip area efficiency, which means there is neit
Autor:
Chien-Chung Hung, Yao-Feng Huang, Cheng-Tyng Yen, Fu-Jen Hsu, Hsiang-Ting Hung, Tzong-Liang Chen, Chwan-Ying Lee, Lurng-Shehng Lee
Publikováno v:
Materials Science Forum. 897:533-536
The NBTI characteristics of SiC MOSFET were studied by the subthreshold swing. The subthreshold swing was found to be very sensitive to the starting bias of transfer curve. The increase of subthreshold swing for MOSFET with poor oxide reached 400% wh
Publikováno v:
2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD).
An integrated back-to-back SiC Zener diode is proposed and designed as an asymmetric bidirectional voltage clamp between the gate and source to protect the gate oxide of SiC MOSFET from the overvoltage stress. The leakage current of integrated SiC Ze
Publikováno v:
2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD).
To prevent the degradation caused by Bessel plane dislocation and improve the characteristics of body diode in silicon carbide MOSFETs, Schottky barrier diode integrated MOSFET has been developed by many researchers. One of those structures was named
Autor:
Cheng-Tyng Yen, Fu-Jen Hsu, Yao Feng Huang, Lurng Shehng Lee, Chien Chung Hung, Pei Ju Chuang, Heng Yuan Lee, Hsiang Ting Hung, Chwan Ying Lee, Chi-Yin Cheng
Publikováno v:
Materials Science Forum. 858:595-598
MOSFETs and MOS capacitors (MOSCAPs) have been fabricated on Si-face of 4H-SiC to investigate the negative bias temperature instability (NBTI) characteristics of SiC MOSFETs. The shifts of threshold voltage of MOSFETs ranged from -216mV to -1257mV af
Autor:
Kuo-Ting Chu, Cheng-Tyng Yen, Lurng-Shehng Lee, Fu-Jen Hsu, Chien-Chung Hung, Chwan-Ying Lee, Ya-Fang Li
Publikováno v:
2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD).
This paper provides a method to match characteristics of SiC MOSFET by a simple SPICE model. Besides, this method not only reaches highly approximate results in an accuracy of characteristics compared to commercial SiC SPICE model but also reduces lo
Autor:
Chien-Chung Hung, Lurng-Shehng Lee, Chwan-Ying Lee, Kuo-Ting Chu, Cheng-Tyng Yen, Ya-Fang Li, Fu-Jen Hsu
Publikováno v:
2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD).
A process and a scalable structure were used to implement the SiC MOSFET with integrated junction barrier controlled Schottky diode (JMOS) without area penalty. The JMOS could provide similar on-resistance and drain-source breakdown voltage with the
Autor:
Yao Feng Huang, Tzu Ming Yang, Chien Chung Hung, Lurng Shehng Lee, Hsiang Ting Hung, Chwan Ying Lee, Cheng-Tyng Yen, Chi-Yin Cheng
Publikováno v:
Materials Science Forum. :729-732
The influences of positive fixed oxide charges and donor-like interface traps on breakdown voltages of SiC devices with FGR and JTE terminations were studied. The breakdown voltages of devices with both FGR and JTE terminations were found to degrade
Autor:
Chwan-Ying Lee, Pei-Ju Chuang, Cheng-Tyng Yen, Fu-Jen Hsu, Hsiang-Ting Hung, Tzong-Liang Chen, Yao-Feng Huang, Lurng-Shehng Lee, Chien-Chung Hung
Publikováno v:
2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD).
A junction barrier controlled Schottky rectifier integrated silicon carbide MOSFET (SiC JMOS) is proposed in this paper, which merged a double implanted MOSFET (DMOS) and junction barrier controlled Schottky diode (JBS) in a monolithic SiC device wit