Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Lupe Duncan"'
Publikováno v:
International Symposium for Testing and Failure Analysis.
Random single bit failures were encountered in cache areas of Motorola’s 0.13 µm CMOS products under development. Extensive in-line probe data and end-of-line probe data in conjunction with failure analysis indicated the presence of particles at t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::db4fdb11643d41ef2bb23f18e0e7b111
https://doi.org/10.31399/asm.cp.istfa2003p0206
https://doi.org/10.31399/asm.cp.istfa2003p0206
