Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Luke Farrugia"'
Publikováno v:
Ecological Solutions and Evidence, Vol 5, Iss 2, Pp n/a-n/a (2024)
Abstract Invasive crayfish are an important ecological concern in many freshwater ecosystems. Many efforts have been made to eradicate them, but there is very little documentation of the effectiveness of these efforts. Between 2019 and 2020, a restor
Externí odkaz:
https://doaj.org/article/5b30851b355546e480d85aec3ac5cf19
Publikováno v:
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC).
Autor:
Mark Luke Farrugia
Publikováno v:
2016 IEEE 18th Electronics Packaging Technology Conference (EPTC).
Since the introduction of Cu wire-bonding in the semiconductor industry, corrosion of the Cu-Al intermetallics (IMCs) has been one of the main concerns in developing reliable products using this interconnect technology. Much insight has been gained i
Publikováno v:
Molecular Simulation. 34:1149-1158
We simulate and analyse three types of two-dimensional networked polymers which have been predicted to exhibit on-axis auxetic behaviour (negative Poisson's ratio), namely (1) polyphenylacetylene networks that behave like flexing re-entrant honeycomb
Publikováno v:
2014 IEEE 64th Electronic Components and Technology Conference (ECTC).
Large scale conversion of gold to copper wiring in microelectronics can only become successful when all the failure mechanisms that can be encountered during reliability testing, or during product application life are understood. One of these mechani
Autor:
Mark Luke Farrugia
Publikováno v:
2013 IEEE 15th Electronics Packaging Technology Conference (EPTC 2013).
Copper wire bonding as a replacement to the long established gold wire process has gained significant momentum in the last years. Wire bonding specialists have struggled with copper's mechanical, physical and chemical differences to gold, in developi
Autor:
Benjamin März, Michael Rother, Tina Li, Kan Lee, Hans-Juergen Funke, Robert Klengel, Mandy Ullrich, Mark Luke Farrugia, Karina Leung, Tim Boettcher, Martin Li, Orla O'Halloran, Andreas Pinkernelle, Matthias Petzold, Michael Kaiser, Stefan Liedtke, Marc Bollmann, Daniel Gruber
Publikováno v:
2010 12th Electronics Packaging Technology Conference.
A detailed description of the Cu-Al wire bond interface is presented, which can possibly explain the often observed corrosion failures in humidity reliability tests. Using micro-structural analysis techniques, it is shown that the unstressed interfac
Conference
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