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pro vyhledávání: '"Luke Eaton"'
Autor:
Noel Kennedy, Ray Duffy, Luke Eaton, Dan O’Connell, Scott Monaghan, Shane Garvey, James Connolly, Chris Hatem, Justin D. Holmes, Brenda Long
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 9, Iss 1, Pp 2106-2113 (2018)
This paper details the application of phosphorus monolayer doping of silicon on insulator substrates. There have been no previous publications dedicated to the topic of MLD on SOI, which allows for the impact of reduced substrate dimensions to be pro
Externí odkaz:
https://doaj.org/article/c7758da9c4044545a54d90af027e4eb4
Autor:
Justin D. Holmes, Shane Garvey, Noel Kennedy, Mary A. Kennedy, Luke Eaton, Michael Nolan, Barbara Maccioni, Brenda Long, Fintan Meaney, Ray Duffy
Publikováno v:
Langmuir. 36:9993-10002
Reported here is a new chemical route for the wet chemical functionalization of germanium (Ge), whereby arsanilic acid is covalently bound to a chlorine (Cl)-terminated surface. This new route is used to deliver high concentrations of arsenic (As) do
Autor:
Scott Monaghan, Justin D. Holmes, James Connolly, Brenda Long, C. Hatem, Noel Kennedy, Luke Eaton, Shane Garvey, Ray Duffy, D. O'Connell
Publikováno v:
Beilstein Journal of Nanotechnology
Beilstein Journal of Nanotechnology, Vol 9, Iss 1, Pp 2106-2113 (2018)
Beilstein Journal of Nanotechnology, Vol 9, Iss 1, Pp 2106-2113 (2018)
This paper details the application of phosphorus monolayer doping of silicon on insulator substrates. There have been no previous publications dedicated to the topic of MLD on SOI, which allows for the impact of reduced substrate dimensions to be pro
Autor:
C. Hatem, Gioele Mirabelli, Dirch Hjorth Petersen, Noel Kennedy, Mary White, Luke Eaton, Fintan Meaney, John MacHale, Ray Duffy, Lida Ansari, James P. Connolly, Rong Lin, Farzan Gity, Kevin Thomas, Emanuele Pelucchi, Nikolay Petkov, Brenda Long
Publikováno v:
MacHale, J, Meaney, F, Kennedy, N, Eaton, L, Mirabelli, G, White, M, Thomas, K, Pelucchi, E, Petersen, D H, Lin, R, Petkov, N, Connolly, J, Hatem, C, Gity, F, Ansari, L, Long, B & Duffy, R 2019, ' Exploring conductivity in ex-situ doped Si thin films as thickness approaches 5 nm ', Journal of Applied Physics, vol. 125, no. 22, 225709 . https://doi.org/10.1063/1.5098307
Journal of Applied Physics
Journal of Applied Physics
Silicon (Si) has been scaled below 10 nm in multigate and silicon-on-insulator (SOI) device technologies, but clearly Si thickness cannot be reduced indefinitely, as we will run out of atoms eventually. As thickness approaches 5 nm, surfaces and inte
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e293c5bc3eb830b7977da357b72e1b4b
https://orbit.dtu.dk/en/publications/5441f8e7-228e-4dda-9f16-70d3bce7c5bf
https://orbit.dtu.dk/en/publications/5441f8e7-228e-4dda-9f16-70d3bce7c5bf
Publikováno v:
The Way Ahead. :22-24
Technical Leaders Interview - An interview on deepwater operations with Luke Eaton of ConocoPhillips, Darryl Herrington of LLOG Exploration, and John Thorogood, drilling global consultant.