Zobrazeno 1 - 10
of 58
pro vyhledávání: '"Luis Miaja-Avila"'
Autor:
Paul Szypryt, Nathan Nakamura, Daniel T. Becker, Douglas A. Bennett, Amber L. Dagel, W. Bertrand Doriese, Joseph W. Fowler, Johnathon D. Gard, J. Zachariah Harris, Gene C. Hilton, Jozsef Imrek, Edward S. Jimenez, Kurt W. Larson, Zachary H. Levine, John A. B. Mates, D. McArthur, Luis Miaja-Avila, Kelsey M. Morgan, Galen C. O'Neil, Nathan J. Ortiz, Christine G. Pappas, Daniel R. Schmidt, Kyle R. Thompson, Joel N. Ullom, Leila Vale, Michael R. Vissers, Christopher Walker, Joel C. Weber, Abigail L. Wessels, Jason W. Wheeler, Daniel S. Swetz
Publikováno v:
IEEE Transactions on Applied Superconductivity. 33:1-5
We report on the 1,000-element transition-edge sensor (TES) x-ray spectrometer implementation of the TOMographic Circuit Analysis Tool (TOMCAT). TOMCAT combines a high spatial resolution scanning electron microscope (SEM) with a highly efficient and
Publikováno v:
Microscopy and Microanalysis. 27:412-415
Autor:
Wilfred K. Fullagar, Jens Uhlig, Ujjwal Mandal, Dharmalingam Kurunthu, Amal El Nahhas, Hideyuki Tatsuno, Alireza Honarfar, Fredrik Parnefjord Gustafsson, Villy Sundström, Mikko R. J. Palosaari, Kimmo M. Kinnunen, Ilari J. Maasilta, Luis Miaja-Avila, Galen C. O'Neil, Young Il Joe, Daniel S. Swetz, Joel N. Ullom
Publikováno v:
Structural Dynamics, Vol 4, Iss 4, Pp 044011-044011-17 (2017)
The use of low temperature thermal detectors for avoiding Darwin-Bragg losses in lab-based ultrafast experiments has begun. An outline of the background of this new development is offered, showing the relevant history and initiative taken by this wor
Externí odkaz:
https://doaj.org/article/43a022d2b9854e8bb787b20859f9cb6a
Autor:
Paul T. Blanchard, Luis Miaja-Avila, Norman A. Sanford, Brian P. Gorman, Ann N. Chiaramonti, David R. Diercks
Publikováno v:
Microsc Microanal
Autor:
Matthew D. Brubaker, David R. Diercks, Norman A. Sanford, Brian P. Gorman, Kris A. Bertness, Ashwin K. Rishinaramangalam, Albert V. Davydov, Benjamin W. Caplins, Ann N. Chiaramonti, Luis Miaja-Avila, Daniel F. Feezell, Paul T. Blanchard
Publikováno v:
The Journal of Physical Chemistry C. 125:2626-2635
Laser-pulsed atom probe tomography (LAPT) is a materials characterization technique that has been widely applied in the study and characterization of III-nitride semiconductors. To date, most of th...
Autor:
Deyu Lu, Daniel S. Swetz, Brianna Ganly, Galen C. O'Neil, Luis Miaja-Avila, Joseph W. Fowler, William B. Doriese, Young Il Joe, Bruce Ravel, Joel N. Ullom, Kelsey M. Morgan
Publikováno v:
X-Ray Spectrometry. 50:9-20
Autor:
Luis Miaja-Avila, Galen C. O’Neil, Young I. Joe, Bradley K. Alpert, Niels H. Damrauer, William B. Doriese, Steven M. Fatur, Joseph W. Fowler, Gene C. Hilton, Ralph Jimenez, Carl D. Reintsema, Daniel R. Schmidt, Kevin L. Silverman, Daniel S. Swetz, Hideyuki Tatsuno, Joel N. Ullom
Publikováno v:
Physical Review X, Vol 6, Iss 3, p 031047 (2016)
Experimental tools capable of monitoring both atomic and electronic structure on ultrafast (femtosecond to picosecond) time scales are needed for investigating photophysical processes fundamental to light harvesting, photocatalysis, energy and data s
Externí odkaz:
https://doaj.org/article/5103c3f2008b4aea9e3f5d9cb497bb3a
Autor:
David R. Diercks, Benjamin W. Caplins, Norman A. Sanford, Ann N. Chiaramonti, Luis Miaja-Avila, Paul T. Blanchard
Publikováno v:
Ultramicroscopy
Improvements in the mass resolution of a mass spectrometer directly correlate to improvements in peak identification and quantification. Here, we describe a post-processing technique developed to increase the quality of mass spectra of strongly insul
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b830ba85d06a3e15d4f57558d2c9e37d
https://europepmc.org/articles/PMC7536741/
https://europepmc.org/articles/PMC7536741/
Autor:
Norman A. Sanford, Benjamin W. Caplins, David R. Diercks, Brian P. Gorman, Paul T. Blanchard, Ann N. Chiaramonti, Luis Miaja-Avila
Publikováno v:
Microsc Microanal
This paper describes initial experimental results from an extreme ultraviolet (EUV) radiation-pulsed atom probe microscope. Femtosecond-pulsed coherent EUV radiation of 29.6 nm wavelength (41.85 eV photon energy), obtained through high harmonic gener
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::dfa5953e33b2be249a03c7db6c330b95
https://europepmc.org/articles/PMC7195254/
https://europepmc.org/articles/PMC7195254/
Autor:
Luis Miaja-Avila, Norman A. Sanford, Ann N. Chiaramonti, Benjamin W. Caplins, Brian P. Gorman, David R. Diercks
Publikováno v:
Metrology, Inspection, and Process Control for Microlithography XXXIV.
We present a different approach to laser-assisted atom probe tomography, where instead of using a near-UV laser for inducing a thermal transient, we use an extreme-ultraviolet coherent light source to trigger field ion emission at the tip's apex. The