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pro vyhledávání: '"Luis MA Perdigão"'
Autor:
Maud Dumoux, Thomas Glen, Jake LR Smith, Elaine ML Ho, Luis MA Perdigão, Avery Pennington, Sven Klumpe, Neville BY Yee, David Andrew Farmer, Pui YA Lai, William Bowles, Ron Kelley, Jürgen M Plitzko, Liang Wu, Mark Basham, Daniel K Clare, C Alistair Siebert, Michele C Darrow, James H Naismith, Michael Grange
Publikováno v:
eLife, Vol 12 (2023)
Serial focussed ion beam scanning electron microscopy (FIB/SEM) enables imaging and assessment of subcellular structures on the mesoscale (10 nm to 10 µm). When applied to vitrified samples, serial FIB/SEM is also a means to target specific structur
Externí odkaz:
https://doaj.org/article/fbc6e73bd5344bb9801714368bad32dd
Autor:
Maud Dumoux, Thomas Glen, Jake LR Smith, Elaine ML Ho, Luis MA Perdigão, Avery Pennington, Sven Klumpe, Neville BY Yee, David Andrew Farmer, Pui YA Lai, William Bowles, Ron Kelley, Jürgen M Plitzko, Liang Wu, Mark Basham, Daniel K Clare, C Alistair Siebert, Michele C Darrow, James H Naismith, Michael Grange
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3d771b0ab21da6c07ba6e75f1abff440
https://doi.org/10.7554/elife.83623.sa2
https://doi.org/10.7554/elife.83623.sa2