Zobrazeno 1 - 10
of 17
pro vyhledávání: '"Luigi Ribotta"'
Autor:
Riccardo Pedraza, Alessandro Mosca Balma, Ilaria Roato, Clarissa Orrico, Tullio Genova, Giacomo Baima, Giovanni Nicolao Berta, Andrea Giura, Luigi Ribotta, Donatella Duraccio, Maria Giulia Faga, Federico Mussano
Publikováno v:
Polymers, Vol 16, Iss 17, p 2521 (2024)
The improvement of the mucosal sealing around the implant represents a challenge, one that prompted research into novel materials. To this purpose, a printable poly(ε-caprolactone) (PCL)-based composite loaded with alumina-toughened zirconia (ATZ) a
Externí odkaz:
https://doaj.org/article/fa04985699b64fbd90a7cfeded8d72f6
Unambiguous identification of the measurement methodologies is fundamental to reduce the uncertainty and support traceability of particle shape and size at the nanoscale. In this work, the critical aspects in atomic force microscopy measurements, tha
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9fc6752f993ad02f62026110d6263666
http://hdl.handle.net/11583/2956216
http://hdl.handle.net/11583/2956216
Publikováno v:
Ultramicroscopy. 234
Since both size and shape of nanoparticles are challenging to be quantitatively measured, traceable 3D measurements are nowadays an issue. 3D nanometrology plays a crucial role to reduce the uncertainty of measurements, improve traceable calibration
Publikováno v:
Politecnico di Torino-IRIS
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::e1154f2499fdd1411483883440e9ec4e
http://hdl.handle.net/11583/2761072
http://hdl.handle.net/11583/2761072
Publikováno v:
Measurement science & technology (Online) 31 (2020). doi:10.1088/1361-6501/ab7bc2
info:cnr-pdr/source/autori:Picotto G.B., Vallino M., Ribotta L./titolo:Tip-sample characterization in the AFM study of a rod-shaped nanostructure/doi:10.1088%2F1361-6501%2Fab7bc2/rivista:Measurement science & technology (Online)/anno:2020/pagina_da:/pagina_a:/intervallo_pagine:/volume:31
info:cnr-pdr/source/autori:Picotto G.B., Vallino M., Ribotta L./titolo:Tip-sample characterization in the AFM study of a rod-shaped nanostructure/doi:10.1088%2F1361-6501%2Fab7bc2/rivista:Measurement science & technology (Online)/anno:2020/pagina_da:/pagina_a:/intervallo_pagine:/volume:31
Accurate measurements of line-width standards, sidewalls and non-spherical nanoparticles performed at the nanoscale by means of atomic force microscopy (AFM) suffer from errors due to the tip shape and size. To reduce the uncertainty, the study here
Publikováno v:
Politecnico di Torino-IRIS
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::80d38998e6140d92b7f35288852ec892
http://hdl.handle.net/11583/2731301
http://hdl.handle.net/11583/2731301
Publikováno v:
Surface Topography: Metrology and Properties. 7:035009
Traceable parameters for determining the relationship between texture, form, sizes and resistance behaviour of functional surfaces' features, such as screen-printed electrodes with grids of different design either on c-Si photovoltaic cells and on a
Publikováno v:
Surface Topography: Metrology & Properties; Sep2019, Vol. 7 Issue 3, p1-1, 1p