Zobrazeno 1 - 10
of 116
pro vyhledávání: '"Ludwig Josef Balk"'
Autor:
Ralf Heiderhoff, Ludwig Josef Balk
Recognition of defects and their subsequent characterization has to be carried out on a nanoscopic level to ensure that even smallest structures with modified material properties can be evaluated. This is a trivial need due to the fact that the oncom
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bfbf871e36036bc1aebb19e009165d64
https://doi.org/10.1201/9781315140810-1
https://doi.org/10.1201/9781315140810-1
Autor:
Ralf Heiderhoff, Ludwig Josef Balk
Publikováno v:
Handbook of Nanoscopy, Volume 1&2
Publikováno v:
Microelectronics Reliability. 50:1459-1463
Thermally induced stress is determined using boundary values obtained by complementary Scanning Joule Expansion Microscopy and Scanning Thermal Microscopy. The stress function is then solved with the Finite Element Method. Surface stress analysis as
Publikováno v:
Microelectronics Reliability. 49:1165-1168
Thermo-elastic properties on aluminum interconnects are characterized by Scanning Joule Expansion Microscopy and complementary finite element analyses. Temperature distributions can be obtained by the correlation of the three-dimensional thermal expa
Autor:
Ralf Heiderhoff, Javier Piqueras, Ludwig Josef Balk, Luca Gregoratti, David Maestre, Ana Cremades
Publikováno v:
Journal of Nanoscience and Nanotechnology. 9:1772-1777
Sintering SnO(2) powder in air or under an oxygen atmosphere at different temperatures, leads to polycrystalline samples with nanostructured surface as revealed by atomic force microscopy (AFM). The thermal treatments are also responsible for the var
Publikováno v:
Microelectronics Reliability. 48:1285-1288
We demonstrate a scanning near-field photon emission microscope (SNPEM) for monitoring photon emission sites with spatial resolution beyond the diffraction limit. Success of SNPEM analysis strongly depends on the sensitivity of photon emission detect
Autor:
Ludwig Josef Balk, Xiaohui Yang, Argiri Tsami, Dieter Neher, Elisabeth Holder, Sylwia Adamczyk, Frank Galbrecht, Li Hongbo, Ralf Heiderhoff, Tony Farrell
Publikováno v:
Journal of Polymer Science Part A: Polymer Chemistry. 45:4773-4785
Two series of novel random polyfluorene copolymers containing quinoxaline units were prepared by stressing the coupling according to Yamamoto. The first series contains 2,3-bis-(4′-tert-butyl-biphenyl-4-yl)benzo[g]quinoxaline and the second series
Autor:
Stelios A. Choulis, Sylwia Adamczyk, David Mühlbacher, Mauro Morana, Ralf Heiderhoff, Markus Koppe, Askin Bilge, Ludwig Josef Balk, Ullrich Scherf, Michael Forster, Markus C. Scharber, Guoli Tu, Christoph J. Brabec
Publikováno v:
Macromolecular Rapid Communications. 28:1781-1785
The hole mobility and power conversion efficiency of bulk heterojunction solar cells based on P3HT-type donor polymers and the soluble fullerene derivative [6,6]-phenyl C 61 butyric acid methyl ester (PCBM) as an acceptor both show a strong sensitivi
Publikováno v:
Microelectronics Reliability. 47:1529-1533
Time resolved investigations of electric field distributions in the near-surface regions of a dynamically biased power device using spectral EBIC microscopy are introduced. The technique described provides a facility for determination of local electr
Publikováno v:
Journal of Scanning Probe Microscopy. 2:15-18