Zobrazeno 1 - 10
of 107
pro vyhledávání: '"Ludger Koenders"'
Publikováno v:
Sensors, Vol 21, Iss 13, p 4270 (2021)
Capacitive sensors are widely used in industrial applications, such as CNC machine tools, where reliable positioning in the micrometer range with nanometer accuracy is required. Hence, these sensors are operated in harsh industrial environments. The
Externí odkaz:
https://doaj.org/article/c37eed07546e4c758578b649de8c6019
Autor:
Nursidik Yulianto, Steffen Bornemann, Lars Daul, Christoph Margenfeld, Irene Manglano Clavero, Nurhalis Majid, Ludger Koenders, Winfried Daum, Andreas Waag, Hutomo Suryo Wasisto
Publikováno v:
Proceedings, Vol 2, Iss 13, p 891 (2018)
Transferable substrate-less InGaN/GaN light-emitting diode (LED) chips have successfully been fabricated in a laser lift-off (LLO) process employing high power ultrashort laser pulses with a wavelength of 520 nm. The irradiation of the sample was con
Externí odkaz:
https://doaj.org/article/3f4a9dbb62744260970495299bd75bfb
Publikováno v:
Measurement Science and Technology. 33:014004
Capacitive sensors enable non-contact displacement measurements in the micrometer range with sub-nanometer resolution. To achieve this, a proper alignment of capacitive sensors is necessary. In this work, a non-contact, automated and intrinsic adjust
Publikováno v:
Applied Surface Science. 421:624-629
As one of the reference measurement methods for future realization of the unit of mass (kilogram) and Avogadro constant NA, the silicon (Si) sphere method employs the ellipsometry for the measurement of the thickness of the ultrathin (
Publikováno v:
Optics Communications. 493:126997
We present an all-fiber sinusoidal phase modulation (SPM) interferometer for displacement measurement based on an in-built electro-optical modulator (EOM). The interferometer consists of a fiber-optical Mach–Zehnder interferometer (MZI) and a low-f
Publikováno v:
Journal of Loss Prevention in the Process Industries. 49:822-831
Electric arcs pose an ignition hazard in the presence of flammable gas mixtures. Electrical equipment to be used in such hazardous environments shall therefore satisfy strict safety requirements, through the use of internationally standardized explos
Publikováno v:
tm - Technisches Messen. 83:681-695
Zusammenfassung Für Vergleiche von Flächenrauheiten mit optischen Messinstrumenten wurden verschiedene Silizium-Vergleichsproben mit Rauheiten zwischen 8 nm Sa Wie die Messergebnisse eindrucksvoll zeigen, eignen sich die untersuchten Proben als Ma
Publikováno v:
Modeling Aspects in Optical Metrology VII.
The topography fidelity TFi indicates the accuracy of the estimation of the real surface, describes the instrument influenced deviation of a measured topography image and depends on the interaction of the surface topography with the instrument. To un
Autor:
Jailton Carreteiro Damasceno, J Mata-Salazar, Wolfgang E. S. Unger, C S Kim, C. A. Achete, Toshiyuki Fujimoto, Donald Windover, Michael Krumrey, Alexander G. Shard, A. S. Kim, Werner Jordaan, Akira Kurokawa, Lulu Zhang, H Ruh, Ludger Koenders, M. Wang, S W Song, Hai Wang, Braulio S. Archanjo, A Herrera-Gomez, Yasushi Azuma, Carlos Alberto Senna, Chris Jeynes, I. Busch, J M Juarez-Garcia, E Steel, O Cortazar-Martinez, Kyung Joong Kim, P E Hansen, J Radnik, Steve J. Spencer, Shinya Terauchi, J S Madesen
Publikováno v:
Metrologia. 58:08016
Main text A pilot study for the thickness measurement of HfO2 films was performed by the Surface Analysis Working Group (SAWG) of the Consultative Committee for Amount of Substance (CCQM). The aim of this pilot study was to ensure the equivalency in