Zobrazeno 1 - 10
of 32
pro vyhledávání: '"Lucile C. Teague"'
Autor:
Lucile C. Teague Sheridan, Don Nedeau
Publikováno v:
EDFA Technical Articles. 22:22-28
Scanning capacitance microscopy (SCM) and nanoprobing are key tools for isolating and understanding transistor level fails. In this case study, SCM and nanoprobing are used to determine the electrical characteristics of cluster-type failures in 14 nm
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bd8deb5750c89a5c06be2252660b3683
https://doi.org/10.31399/asm.edfa.2020-2.p022
https://doi.org/10.31399/asm.edfa.2020-2.p022
Autor:
Daniel Marienfeld, Randy W. Mann, Lucile C. Teague Sheridan, Yuncheng Song, Chong Khiam Oh, Joseph Versaggi, Sheng Xie, Dirk Fimmel, Wolfgang Finger, Dapeng Sun, Matthias Hoffmann
Publikováno v:
2019 IEEE 11th International Memory Workshop (IMW).
This work reports the application of an ultra-fast insitu characterization capability in SRAM array in advanced nodes. The methodology was tested in fully functional SRAM arrays in 14 nm and 7 nm FinFET nodes, allowing assessment of individual device
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e07528e71def4ad442e734cdc156d1b9
https://doi.org/10.1109/imw.2019.8739413
https://doi.org/10.1109/imw.2019.8739413
Publikováno v:
International Symposium for Testing and Failure Analysis.
It is widely acknowledged that Atomic force microscopy (AFM) methods such as conductive probe AFM (CAFM) and Scanning Capacitance Microscopy (SCM) are valuable tools for semiconductor failure analysis. One of the main advantages of these techniques i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::de8d24bb7aee0b447b91f2b0be518bb1
https://doi.org/10.31399/asm.cp.istfa2018p0543
https://doi.org/10.31399/asm.cp.istfa2018p0543
Autor:
Jonathan S. Wright, Aaron L. Washington, Lucile C. Teague, Michael Groza, Vladimir Buliga, Arnold Burger, Martine C. Duff
Publikováno v:
Journal of Electronic Materials. 44:3207-3213
The performance of Cd1−x Zn x Te (CZT) materials for room-temperature gamma/x-ray radiation detection continues to improve in terms of material quality and detector design. In our prior publications, we investigated the use of multiple wavelengths
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3efa46e93ce0246450dab4c069fd7eb8
https://doi.org/10.1007/s11664-015-3926-y
https://doi.org/10.1007/s11664-015-3926-y
Autor:
Tanya Schaeffer, Lucile C. Teague Sheridan, Arnaud Bousquet, Liang-Shan Chen, Bianzhu Fu, Lowell Hodgkins, Chongkhiam Oh
Publikováno v:
International Symposium for Testing and Failure Analysis.
This paper highlights the application of nanoprobing technique and electron tomography analysis to characterize the tiny gate oxide pinhole defect in NMOS FinFET devices. Nanoprobing technique was utilized to achieve a better understanding on the fai
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fdbfa77161dd335d72030f2753634140
https://doi.org/10.31399/asm.cp.istfa2017p0451
https://doi.org/10.31399/asm.cp.istfa2017p0451
Autor:
Sreenath Arva, Karthik Kalaiazhagan, Lucile C. Teague Sheridan, Satish Kodali, Chong Khiam Oh
Publikováno v:
International Symposium for Testing and Failure Analysis.
This paper presents unique case studies describing the use of EBAC technique. Front as well as backside EBAC on relatively smaller nets is presented to isolate logic fails which are otherwise hard to capture using conventional failure analysis techni
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a4de10a613842d0172ad0358ad24544b
https://doi.org/10.31399/asm.cp.istfa2017p0469
https://doi.org/10.31399/asm.cp.istfa2017p0469
Publikováno v:
International Symposium for Testing and Failure Analysis.
Atomic force microscopy (AFM) methods have provided a wealth of knowledge into the topographic, electrical, mechanical, magnetic, and electrochemical properties of surfaces and materials at the micro- and nanoscale over the last several decades. More
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::82c09980ae1f9fffef7da6d038d63da4
https://doi.org/10.31399/asm.cp.istfa2017p0606
https://doi.org/10.31399/asm.cp.istfa2017p0606
Publikováno v:
International Symposium for Testing and Failure Analysis.
There are several methods commonly used to locate the area of interest (AOI), such as using layout landmarks, applying laser marks, focus ion beam marks, etc. This paper discusses another method which can improve the job efficiency and cost-effective
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a4220de7a24b263631633ebab8f1c8f7
https://doi.org/10.31399/asm.cp.istfa2017p0550
https://doi.org/10.31399/asm.cp.istfa2017p0550
Autor:
James R. Cadieux, Raji Soundararajan, Martine C. Duff, Lucile C. Teague, Charles R. Shick, Kelvin G. Lynn
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 652:178-182
A combination of atomic force microscopy, optical microscopy, and mass spectrometry was employed to study CdZnTe crystal surface and used etchant solution following exposure of the CdZnTe crystal to the Everson etch solution. We discuss the results o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c480cb4785b0867ee657cd39c0657398
https://doi.org/10.1016/j.nima.2010.09.061
https://doi.org/10.1016/j.nima.2010.09.061
Publikováno v:
Journal of the American Chemical Society. 133:14287-14292
We consider the reaction of 1,3-cyclohexadiene (1,3-CHD) on Si(100) and show that the observed reactivity and stereoselectivity cannot be explained on the basis of thermodynamics. We postulate the existence of secondary orbital interactions (SOIs) an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::faa8c0666b815b250b929e1d9efb23e1
https://doi.org/10.1021/ja111539b
https://doi.org/10.1021/ja111539b