Zobrazeno 1 - 10
of 14
pro vyhledávání: '"Lucie Hüser"'
Autor:
Vahid Abbasian, Tobias Pahl, Lucie Hüser, Sylvain Lecler, Paul Montgomery, Peter Lehmann, Arash Darafsheh
Publikováno v:
Light: Advanced Manufacturing, Vol 5, Iss 1, Pp 133-152 (2024)
Light microscopes are the most widely used devices in life and material sciences that allow the study of the interaction of light with matter at a resolution better than that of the naked eye. Conventional microscopes translate the spatial difference
Externí odkaz:
https://doaj.org/article/fa08dc81c3704bf5b82800deef762474
Publikováno v:
Light: Advanced Manufacturing, Vol 3, Pp 1-13 (2022)
To improve the lateral resolution in microscopic imaging, microspheres are placed close to the object’ s surface in order to support the imaging process by optical near-field information. Although microsphere-assisted measurements are part of vario
Externí odkaz:
https://doaj.org/article/a0a5583aa2ab45c182b27646cbba2cf9
Publikováno v:
JPhys Photonics, Vol 5, Iss 1, p 015001 (2023)
The lateral resolution in microscopic imaging generally depends on both, the wavelength of light and the numerical aperture of the microscope objective lens. To quantify the lateral resolution Ernst Abbe considered an optical grating illuminated by p
Externí odkaz:
https://doaj.org/article/9022c37b75de4ef89d15ebeb1bb923cb
Publikováno v:
Journal of the European Optical Society-Rapid Publications, Vol 15, Iss 1, Pp 1-9 (2019)
Abstract Interference signals in coherence scanning interferometry at high numerical apertures and narrow bandwidth illumination are spectrally broadened. This enables phase analysis within a spectral range much wider than the spectral distribution o
Externí odkaz:
https://doaj.org/article/c25d85e6789d4fd29d0174b2d4138596
Autor:
Lucie Hüser
Publikováno v:
Journal of the European Optical Society-Rapid Publications.
Enhancing the lateral resolution in optical microscopy and interferometry is of great interest in recent research. In order to laterally resolve structures including feature dimensions below the Abbe resolution limit, microspheres in the optical near
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::de75c8137fe8f55523cd04f224bf51ae
https://doi.org/10.1051/jeos/2023029
https://doi.org/10.1051/jeos/2023029
Publikováno v:
Journal of Optical Microsystems. 2
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f8bb2c9b2f8428ee5342e6313f4169d9
https://doi.org/10.1117/1.jom.2.4.044501
https://doi.org/10.1117/1.jom.2.4.044501
Autor:
Lucie Hüser, Peter Lehmann
Publikováno v:
tm - Technisches Messen. 88:311-318
In order to push the limitations of optical measurement technology further and to measure finer structures, various systems have been published in current research. It has been shown that microspheres applied in the near-field can improve the resolut
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c0f9d3e1308a2b7047f516426d7e2d78
https://doi.org/10.1515/teme-2020-0101
https://doi.org/10.1515/teme-2020-0101
Autor:
Lucie Hüser, Peter Lehmann
Publikováno v:
tm - Technisches Messen. 87:s28-s33
Zusammenfassung Um die Grenzen der optischen Messtechnik zu erweitern und feinere Strukturen messbar zu machen, wurden verschiedene Systeme in der aktuellen Forschung publiziert. Es wurde gezeigt, dass im Nahfeld aufgebrachte Mikrokugeln die Auflösu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1cb12d7e083a0759be8b34a358202d1b
https://doi.org/10.1515/teme-2020-0013
https://doi.org/10.1515/teme-2020-0013
Publikováno v:
Journal of Modern Optics. 67:963-973
Optical interference microscopes are widespread in topography and roughness measurement on the micro- and nanoscale. In spite of a wide range of scientific and industrial applications, systematic d...
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2806bcc4297ab9cd3aa54099d976f527
https://doi.org/10.1080/09500340.2020.1801871
https://doi.org/10.1080/09500340.2020.1801871
Autor:
Peter Lehmann, Lucie Hüser
Publikováno v:
Optical Measurement Systems for Industrial Inspection XII.
In optical metrology various approaches have been made in order to push the physical limitations of lateral resolution in microscopic and interferometric devices. Microsphere-assisted interferometry enables the measurement of structures well below Ab
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::09e8e5a7f1f8303bd51855ecf4221c96
https://doi.org/10.1117/12.2593296
https://doi.org/10.1117/12.2593296