Zobrazeno 1 - 10
of 15
pro vyhledávání: '"Lucas Matana Luza"'
Autor:
Annachiara Ruospo, Ernesto Sanchez, Lucas Matana Luza, Luigi Dilillo, Marcello Traiola, Alberto Bosio
Publikováno v:
Computer
Computer, 2023, 56, pp.57-66. ⟨10.1109/MC.2022.3217841⟩
Computer, 2023, 56, pp.57-66. ⟨10.1109/MC.2022.3217841⟩
International audience; Deep Learning (DL) applications are gaining increasing interest in the industry and academia for their outstanding computational capabilities. Indeed, they have found successful applications in various areas and domains such a
Autor:
Lucas Matana Luza, Arto Javanainen, Wilfrid Farabolini, Antonio Gilardi, Christian Poivey, Luigi Dilillo, Daniel Soderstrom, Heikki Kettunen, Andrea Coronetti
Publikováno v:
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2021, 68 (5), pp.716-723. ⟨10.1109/TNS.2021.3068186⟩
IEEE Nuclear and Space Radiation Effects Conference (NSREC 2020)
IEEE Nuclear and Space Radiation Effects Conference (NSREC 2020), Nov 2020, Santa Fe (virtual), United States
IEEE Transactions on Nuclear Science, 2021, 68 (5), pp.716-723. ⟨10.1109/TNS.2021.3068186⟩
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2021, 68 (5), pp.716-723. ⟨10.1109/TNS.2021.3068186⟩
IEEE Nuclear and Space Radiation Effects Conference (NSREC 2020)
IEEE Nuclear and Space Radiation Effects Conference (NSREC 2020), Nov 2020, Santa Fe (virtual), United States
IEEE Transactions on Nuclear Science, 2021, 68 (5), pp.716-723. ⟨10.1109/TNS.2021.3068186⟩
This study investigates the response of synchronous dynamic random access memories to energetic electrons and especially the possibility of electrons to cause stuck bits in these memories. Three different memories with different node sizes (63, 72, a
Autor:
Manon Letiche, Alberto Bosio, Daniel Soderstrom, Lucas Matana Luza, Helmut Puchner, Ruben Garcia Alia, Luigi Dilillo, Carlo Cazzaniga
Publikováno v:
Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2022, 128, pp.#114406. ⟨10.1016/j.microrel.2021.114406⟩
Microelectronics Reliability, Elsevier, 2022, 128, pp.#114406. ⟨10.1016/j.microrel.2021.114406⟩
International audience; The field of radiation effects in electronics research includes unknowns for every new device, node size, and technical development. In this study, static and dynamic test methods were used to define the response of a self-ref
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c90d78045df5b34043b806ac465a30ee
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03435635/document
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03435635/document
Autor:
Annachiara Ruospo, Lucas Matana Luza, Alberto Bosio, Marcello Traiola, Luigi Dilillo, Ernesto Sanchez
Publikováno v:
LATS 2021-IEEE 22nd Latin American Test Symposium
LATS 2021-IEEE 22nd Latin American Test Symposium, Oct 2021, Punta del Este, Uruguay. pp.1-5, ⟨10.1109/LATS53581.2021.9651807⟩
IEEE Latin-American Test Symposium (LATS 2021)
IEEE Latin-American Test Symposium (LATS 2021), Oct 2021, Punta del Este, Uruguay
LATS 2021-IEEE 22nd Latin American Test Symposium, Oct 2021, Punta del Este, Uruguay. pp.1-5, ⟨10.1109/LATS53581.2021.9651807⟩
IEEE Latin-American Test Symposium (LATS 2021)
IEEE Latin-American Test Symposium (LATS 2021), Oct 2021, Punta del Este, Uruguay
International audience; In the last years, the adoption of Artificial Neural Networks (ANNs) in safety-critical applications has required an in-depth study of their reliability. For this reason, the research community has shown a growing interest in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0972e236925cd6c74d6f97eab89ab7f6
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03435567
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03435567
Autor:
Carlo Cazzaniga, Lucas Matana Luza, Cesar Albenes Zeferino, Luigi Dilillo, Douglas Rossi de Melo, Douglas Almeida dos Santos, Maria Kastriotou
Publikováno v:
DTIS 2021-16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era
DTIS 2021-16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505054⟩
DTIS
16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2021)
16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2021), Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505054⟩
DTIS 2021-16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505054⟩
DTIS
16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2021)
16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2021), Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505054⟩
International audience; Systems for harsh environments often use embedded processors for tasks that require reliability. However, harsh environments cause faulty behavior in electronics, which eventually lead to system failure. Therefore, embedded pr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cd77bfd30e9744e3bf491e52330d1163
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03357515
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03357515
Publikováno v:
24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS 2021)
24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS 2021), Apr 2021, Vienna, Austria. pp.41-44, ⟨10.1109/DDECS52668.2021.9417059⟩
DDECS
24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS 2021), Apr 2021, Vienna, Austria. pp.41-44, ⟨10.1109/DDECS52668.2021.9417059⟩
DDECS
International audience; Solutions based on artificial intelligence and brain-inspired computations like Artificial Neural Networks (ANNs) are suited to deal with the growing computational complexity required by state-of-the-art electronic devices. Ma
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::18cca3c947860c6c118c2ec590cb59a0
https://hal.archives-ouvertes.fr/hal-03266848
https://hal.archives-ouvertes.fr/hal-03266848
Autor:
Carlo Cazzaniga, Eduardo Augusto Bezerra, Maria Kastriotou, Christian Poivey, Lucas Matana Luza, Daniel Soderstrom, Luigi Dilillo, Andre Martins Pio de Mattos
Publikováno v:
16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2021)
16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2021), Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505143⟩
DTIS
DTIS 2021-16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era
DTIS 2021-16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505143⟩
2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2021), Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505143⟩
DTIS
DTIS 2021-16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era
DTIS 2021-16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505143⟩
2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
International audience; This study analyses the response of synchronous dynamic random access memories to neutron irradiation. Three different generations of the same device with different node sizes (63, 72, and 110 nm) were characterized under an a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f7f28ed80a486f1971c2376760536693
http://urn.fi/URN:NBN:fi:jyu-202111015465
http://urn.fi/URN:NBN:fi:jyu-202111015465
Autor:
Alberto Bosio, Luigi Dilillo, Daniel Soderstrom, Ernesto Sanchez, Lucas Matana Luza, Georgios Tsiligiannis, Helmut Puchner, Carlo Cazzaniga
Publikováno v:
DFT 2020-33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
DFT 2020-33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2020, Frascati, Italy. pp.1-6, ⟨10.1109/DFT50435.2020.9250865⟩
2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
DFT
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2020)
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2020), Oct 2020, Frascati, Italy. pp.1-6, ⟨10.1109/DFT50435.2020.9250865⟩
DFT 2020-33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2020, Frascati, Italy. pp.1-6, ⟨10.1109/DFT50435.2020.9250865⟩
2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
DFT
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2020)
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2020), Oct 2020, Frascati, Italy. pp.1-6, ⟨10.1109/DFT50435.2020.9250865⟩
International audience; Approximate Computing (AxC) is a well-known paradigm able to reduce the computational and power overheads of a multitude of applications, at the cost of a decreased accuracy. Convolutional Neural Networks (CNNs) have proven to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::86a05219feb7539dc9e603d7e0d91479
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025736/document
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025736/document
Autor:
Douglas Rossi de Melo, Lucas Matana Luza, Cesar Albenes Zeferino, Luigi Dilillo, Douglas Almeida dos Santos
Publikováno v:
DTIS 2020-15th Design & Technology of Integrated Systems in Nanoscale Era
DTIS 2020-15th Design & Technology of Integrated Systems in Nanoscale Era, Apr 2020, Marrakech, Morocco. pp.1-5, ⟨10.1109/DTIS48698.2020.9081185⟩
15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2020)
15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2020), Apr 2020, Marrakech, Morocco. pp.1-5, ⟨10.1109/DTIS48698.2020.9081185⟩
DTIS
DTIS 2020-15th Design & Technology of Integrated Systems in Nanoscale Era, Apr 2020, Marrakech, Morocco. pp.1-5, ⟨10.1109/DTIS48698.2020.9081185⟩
15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2020)
15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2020), Apr 2020, Marrakech, Morocco. pp.1-5, ⟨10.1109/DTIS48698.2020.9081185⟩
DTIS
International audience; Embedded processors have been used in a diversity of applications, such as consumer electronics, home appliances, and automation systems. Another area that embedded processors can be adopted is space systems, which demand faul
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b955b1b3b3eef842d003b50ecaee29a8
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03026132
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03026132
Autor:
Lucas Matana Luza, Ruben Garcia Alia, Manon Letiche, Luigi Dilillo, Daniel Soderstrom, Helmut Puchner, Alberto Bosio
Publikováno v:
2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
DTIS
15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2020)
15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2020), Apr 2020, Marrakech, Morocco. pp.1-6, ⟨10.1109/DTIS48698.2020.9080918⟩
DTIS 2020-15th Design & Technology of Integrated Systems in Nanoscale Era
DTIS 2020-15th Design & Technology of Integrated Systems in Nanoscale Era, Apr 2020, Marrakech, Morocco. pp.1-6, ⟨10.1109/DTIS48698.2020.9080918⟩
DTIS
15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2020)
15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2020), Apr 2020, Marrakech, Morocco. pp.1-6, ⟨10.1109/DTIS48698.2020.9080918⟩
DTIS 2020-15th Design & Technology of Integrated Systems in Nanoscale Era
DTIS 2020-15th Design & Technology of Integrated Systems in Nanoscale Era, Apr 2020, Marrakech, Morocco. pp.1-6, ⟨10.1109/DTIS48698.2020.9080918⟩
International audience; In this study, static and dynamic test methods were used to define the response of a self-refresh DRAM under thermal neutron irradiation. The neutron-induced failures were investigated and characterized by event cross-sections