Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Luís R. L. Pacheco"'
Publikováno v:
Applied Sciences, Vol 14, Iss 6, p 2376 (2024)
Atomic force microscopy (AFM) is a powerful technique to study the nanomechanical properties of a wide range of materials at the piconewton level. AFM force–indentation curves can be fitted with appropriate contact models, enabling the determinatio
Externí odkaz:
https://doaj.org/article/e3b8134ba48d4158ba3cf603196c8712
