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pro vyhledávání: '"Luís R. L. Pacheco"'
Publikováno v:
Applied Sciences, Vol 14, Iss 6, p 2376 (2024)
Atomic force microscopy (AFM) is a powerful technique to study the nanomechanical properties of a wide range of materials at the piconewton level. AFM force–indentation curves can be fitted with appropriate contact models, enabling the determinatio
Externí odkaz:
https://doaj.org/article/e3b8134ba48d4158ba3cf603196c8712
Publikováno v:
Applied Sciences (2076-3417); Mar2024, Vol. 14 Issue 6, p2376, 16p