Leakage Current Modeling of Test Structures for Characterization of Dark Current in CMOS Image Sensors.

Autor: Loukianova, Natalia V., Folkerts, Hein Otto, Maas, Joris P.V., Verbugt, Daniël W.E., Mierop, Adri J., Hoekstra, Willem, Roks, Edwin, Theuwissen, Albert J.P.

Publikováno v: IEEE Transactions on Electron Devices. Jan2003, Vol. 50 Issue 1, p77. 7p. 8 Black and White Photographs, 3 Diagrams, 2 Charts, 8 Graphs.