Zobrazeno 1 - 10
of 74
pro vyhledávání: '"Louis Y. Ungar"'
Publikováno v:
2022 IEEE AUTOTESTCON.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7aefc133bcd27d8698343195cf38d452
https://doi.org/10.1109/autotestcon47462.2022.9984743
https://doi.org/10.1109/autotestcon47462.2022.9984743
Publikováno v:
2019 IEEE AUTOTESTCON.
Access to internal circuit nodes and elements from the system level improves test and diagnostic coverage. The traditional approach of tearing down a system in order to ascertain whether a subsystem, a circuit board or a component is in fact faulty i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::16fbbcd4dda1191d7259a6bd3396fd51
https://doi.org/10.1109/autotestcon43700.2019.8961045
https://doi.org/10.1109/autotestcon43700.2019.8961045
Publikováno v:
2019 IEEE AUTOTESTCON.
High-speed testing of digital transmission necessitates a functional test, which is typically the test performed by automatic test equipment (ATE) on military and avionics units under test (UUTs). Older military ATEs, and indeed most modern day ATEs,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::96142a89f6c8746b4398b91f3d1417af
https://doi.org/10.1109/autest.2019.8878478
https://doi.org/10.1109/autest.2019.8878478
Publikováno v:
2016 IEEE AUTOTESTCON.
False Alarms (FAs) that occur in a fielded system and No Fault Found (NFF) events that are discovered after line replaceable units (LRUs) have been returned to repair are costly situations whose full impact is difficult to put into monetary terms. Fo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4cd1f45ab8cc0337fdf1f241428aa2ef
https://doi.org/10.1109/autest.2016.7589571
https://doi.org/10.1109/autest.2016.7589571
Autor:
Louis Y. Ungar, Michael D. Sudolsky
Publikováno v:
2016 IEEE AUTOTESTCON.
Design for testability (DFT) should go beyond simply assisting manufacturing test or even beyond fielded unit troubleshooting. Boundary scanned components can be controlled to collect real time snapshots of signals capable of assessing circuit health
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1863032218a1118dcd33c4325c920b5f
https://doi.org/10.1109/autest.2016.7589618
https://doi.org/10.1109/autest.2016.7589618
Autor:
Louis Y. Ungar
Publikováno v:
2015 IEEE AUTOTESTCON.
In acquiring commercial-off-the-shelf (COTS) circuits - circuit boards, shop replaceable assemblies (SRAs), modules, and line replaceable units (LRUs) - the test and support engineers may concede that they are powerless to make COTS systems testable.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f0f99de5628b48879a56ad8480dde72e
https://doi.org/10.1109/autest.2015.7356507
https://doi.org/10.1109/autest.2015.7356507
Autor:
Louis Y. Ungar
Publikováno v:
2015 IEEE AUTOTESTCON.
While test engineering has been busy creating better and more comprehensive tests in response to an ever more complex set of electronics, its status as a profession has steadily declined. The notion that test engineering is necessary, beneficial and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::90ea88f57282dd2f12c27b0298d4d0e1
https://doi.org/10.1109/autest.2015.7356509
https://doi.org/10.1109/autest.2015.7356509
Autor:
Mustafa Ilarslan, Louis Y. Ungar
Publikováno v:
2015 IEEE AUTOTESTCON.
False Alarms (FAs) and No Fault Founds (NFFs) impose a devastating impact on aircraft systems. An entire aircraft can be grounded because of a single avionic for which there are insufficient spares available. If an FA or NFF causes a particular Line
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::64aa298ffc0ce9956ca99d772a1e5a44
https://doi.org/10.1109/autest.2015.7356464
https://doi.org/10.1109/autest.2015.7356464
Autor:
Louis Y. Ungar
Publikováno v:
2013 IEEE AUTOTESTCON.
Design for Testability (DFT) provides for economic benefits and reduction in costs for design, manufacturing and support of electronic systems. The amalgamation of increased benefits and net reduced costs is value enjoyed throughout the life cycle of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0da4a29a26a2e847b262a0637b820fc6
https://doi.org/10.1109/autest.2013.6645065
https://doi.org/10.1109/autest.2013.6645065
Autor:
William G. Duff, Louis Y. Ungar
Publikováno v:
2012 IEEE AUTOTESTCON Proceedings.
Electronic equipment are subject to degradation and failure as a result of aging and corrosion. Diagnosing to the culprit component, however, is usually not obvious. Some strategic and novel electromagnetic interference (EMI) measurements can be util
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e5e51bfd82c2d2f949bd259dca37c868
https://doi.org/10.1109/autest.2012.6334563
https://doi.org/10.1109/autest.2012.6334563