Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Louis S. Farkas"'
Publikováno v:
Scanning. 34:129-134
Summary The success of the helium ion microscope has encouraged extensions of this technology to produce beams of other ion species. A review of the various candidate ion beams and their technical prospects suggest that a neon beam might be the most
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::901f9dbf575ca9b1e9f73eb7c24e1689
https://doi.org/10.1002/sca.20268
https://doi.org/10.1002/sca.20268
Publikováno v:
Microscopy and Microanalysis. 16:200-201
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::27159adae9626aec2eb4e46c77bfbe6e
https://doi.org/10.1017/s1431927610062823
https://doi.org/10.1017/s1431927610062823
Autor:
Sybren Sijbrandij, Shawn McVey, Raymond Hill, John A. Notte, Larry Scipioni, Louis S. Farkas, Colin A. Sanford
Publikováno v:
Microscopy and Microanalysis. 15:654-655
Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::da00e3aa65f553f16cd1573029e893d8
https://doi.org/10.1017/s1431927609094331
https://doi.org/10.1017/s1431927609094331
Publikováno v:
Microscopy and Microanalysis. 12:126-127
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e3c30f031031ceb60a44343e135d5a31
https://doi.org/10.1017/s1431927606069820
https://doi.org/10.1017/s1431927606069820