Výsledky vyhledávání - "Louay Abdallah"

Dynamic Analog/RF Alternate Test Strategies Based on On-chip Learning

Autor: Sharanabasavaraja Bheema Reddy, Louay Abdallah, Parth Kansara, Ke Huang

Publikováno v: Journal of Electronic Testing. 34:337-349

Analog/RF alternate test schemes have been extensively studied in the past decade with the goal of replacing time-consuming and expensive specification tests with low-cost alternate measurements. A common approach in analog/RF alternate test is to bu

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::cfe05bdb88ae76c644c4043920504c13
https://doi.org/10.1007/s10836-018-5724-y

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Test and Calibration of RF Circuits Using Built-in Non-intrusive Sensors

Autor: Haralampos-S. Stratigopoulos, Martin Andraud, Emmanuel Simeu, Athanasios Dimakos, Salvador Mir, Louay Abdallah

Publikováno v: ISVLSI
IEEE International Computer Society Annual Symposium on VLSI (ISVLSI'15)
IEEE International Computer Society Annual Symposium on VLSI (ISVLSI'15), Jul 2015, Montpellier, France. pp.627

Testing the RF functions of mixed-signal Systems-on-Chip is responsible for a very large fraction of the overall test cost. In addition, RF circuits, when designed in the most advanced technologies (e.g. 65nm and beyond), typically require some calib

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4dbd90bbe23b2cd0f16cb562444ae098
https://doi.org/10.1109/isvlsi.2015.42

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Fast Deployment of Alternate Analog Test Using Bayesian Model Fusion

Autor: John Liaperdos, Haralampos-G. Stratigopoulos, Louay Abdallah, Yiorgos Tsiatouhas, Angela Arapoyanni, Xin Li

Publikováno v: Design, Automation and Test in Europe Conference (DATE'15)
Design, Automation and Test in Europe Conference (DATE'15), Mar 2015, Grenoble, France

International audience; n this paper, we address the problem of limited training sets for learning the regression functions in alternate analog test. Typically, a large volume of real data needs to be collected from different wafers and lots over a l

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9e658643ca710e6f83f796aa05c168b9
https://hal.archives-ouvertes.fr/hal-01132465

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Review of temperature sensors as monitors for RF mmW built-in testing and self-calibration schemes

Autor: Jose Silva-Martinez, Xavier Perpiñà, Eduardo Aldrete-Vidrio, Xavier Jordà, Josep Altet, Didac Gómez, Ferran Reverter, Haralampos-G. Stratigopoulos, Baudouin Martineau, Miquel Vellvehi, Louay Abdallah, Xavier Aragones, Stefan Dilhaire, Salvador Mir, Diego Mateo, José Luis González, Marvin Onabajo

Publikováno v: 57th IEEE Midwest Symposium on Circuits and Systems (MWSCAS'14)
57th IEEE Midwest Symposium on Circuits and Systems (MWSCAS'14), Aug 2014, Texas, United States. pp.1081-1084, ⟨10.1109/MWSCAS.2014.6908606⟩
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
Universitat Jaume I
MWSCAS

International audience; This paper presents an overview of the work done so far related to the use of temperature sensors as performance monitors for RF and MMW circuits with the goal to implement built-in testing or self-calibration techniques. The

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4646dad2352feea6dc56ab600e78dac8
https://hal.archives-ouvertes.fr/hal-01118149

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True Non-Intrusive Sensors for RF Built-In Test

Autor: Haralampos-G. Stratigopoulos, Salvador Mir, Louay Abdallah

Publikováno v: IEEE International Test Conference (ITC'13)
IEEE International Test Conference (ITC'13), Sep 2013, Anaheim, CA, United States. pp.1_10, ⟨10.1109/TEST.2013.6651885⟩
ITC

International audience; In this summary paper, we discuss two types of sensors that provide a built-in test solution for RF circuits. The key characteristic of the sensors is that they are non-intrusive, in the sense that they are not electrically co

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::419e7c5374137e602bf8aab3af7c03f4
https://hal.archives-ouvertes.fr/hal-00975407

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Defect-Oriented Non-Intrusive RF Test Using On-Chip Temperature Sensors

Autor: Haralampos-G. Stratigopoulos, Josep Altet, Salvador Mir, Louay Abdallah

Publikováno v: IEEE VLSI Test Symposium (VTS'13)
IEEE VLSI Test Symposium (VTS'13), USA, April 29-May 02
IEEE VLSI Test Symposium (VTS'13), USA, April 29-May 02, Apr 2013, Berkeley, CA, United States. pp.1-6, ⟨10.1109/VTS.2013.6548889⟩
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
Universitat Jaume I
VTS

We present a built-in, defect-oriented test approach for RF circuits that is based on thermal monitoring. A defect will change the power dissipation of the circuit under test from its expected range of values which, in turn, will induce a change in t

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::423eb8866ec22d36311f6614c64c8b89
https://hal.archives-ouvertes.fr/hal-00975942

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Multivariate Statistical Techniques for Analog Parametric Test Metrics Estimation

Autor: Salvador Mir, H-G Stratigopoulos, Ke Huang, Louay Abdallah, Ahcène Bounceur

Publikováno v: DTIS 2013
DTIS 2013, Mar 2013, United Arab Emirates
DTIS
8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), Abu Dhabi, UAE, March 26-28
8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), Abu Dhabi, UAE, March 26-28, Mar 2013, Abu Dhabi, United Arab Emirates. pp.19-24

ISBN 978-1-4673-6038-8; International audience; The high cost for testing the analog blocks of a modern chip has sparked research efforts to replace the standard tests with less costly alternative tests. However, test engineers are rather reluctant t

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::41da1a083dcd7cc207f571627ed26d7f
https://hal.univ-brest.fr/hal-00780022/document

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Accurate estimation of analog test metrics with extreme circuits

Autor: Louay Abdallah, Ke Huang, Kamel Beznia, Reinhardt Euler, Ahcène Bounceur, Salvador Mir

Publikováno v: ICECS

Specification-based testing of analog/RF circuits is very costly due to lengthy test times and highly sophisticated test equipment. Alternative test measures, extracted by means of Built-In Test (BIT) techniques, are a promising approach to replace s

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::1f66d85788dee3b26b42ac112acdeb1a
https://doi.org/10.1109/icecs.2012.6463748

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Experiences with non-intrusive sensors for RF built-in test

Autor: Salvador Mir, Christophe Kelma, Louay Abdallah, Haralampos-G. Stratigopoulos

Publikováno v: Proc. of IEEE International Test Conference (ITC)
IEEE International Test Conference (ITC)
IEEE International Test Conference (ITC), Nov 2012, Anaheim, CA, United States. Paper 17.1-pp. 1-8, ⟨10.1109/TEST.2012.6401587⟩
ITC

ISBN 978-1-4673-1594-4; International audience; This paper discusses a new type of sensors to enable a built-in test in RF circuits. The proposed sensors provide DC or low-frequency measurements, thus they can reduce drastically the testing cost. The

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::70ca645fa1e5bfceb1cfcbcb555b6438
https://hal.archives-ouvertes.fr/hal-00815233

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On Replacing an RF Test with an Alternative Measurement: Theory and a Case Study

Autor: A.D. Spyronasios, Haralampos-G. Stratigopoulos, Louay Abdallah, Salvador Mir

Publikováno v: Proc. of IEEE Asian Test Symposium (ATS'11)
IEEE Asian Test Symposium (ATS'11)
IEEE Asian Test Symposium (ATS'11), Nov 2011, New Delhi, India. pp.365-370, ⟨10.1109/ATS.2011.44⟩
Asian Test Symposium

ISBN 978-1-4577-1984-4; International audience; In this paper we present the theory for evaluating the test error that we commit when we replace a standard analog test by a lower-cost alternative measurement. The evaluation takes place during the des

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b736b4913ad33ccd79106cb285241cfb
https://hal.archives-ouvertes.fr/hal-00672554

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