Zobrazeno 1 - 10
of 115
pro vyhledávání: '"Lou, X. J."'
Autor:
Lou, X. J., Zhang, H. J., Luo, Z. D., Zhang, F. P., Liu, Y., Liu, Q. D., Fang, A. P., Dkhil, B., Zhang, M., Ren, X. B., He, H. L.
The effect of polarization fatigue on the Rayleigh coefficients of ferroelectric lead zirconate titanate (PZT) thin film was systematically investigated. It was found that electrical fatigue strongly affects the Rayleigh behaviour of the PZT film. Bo
Externí odkaz:
http://arxiv.org/abs/1405.5664
Autor:
Lou, X. J., Wang, J.
Publikováno v:
Applied Physics Letters, 96, 102906 (2010)
For the first time, we show that unipolar fatigue does occur in antiferroelectric capacitors, confirming the predictions of a previous work [Appl. Phys. Lett., 94, 072901 (2009)]. We also show that unipolar fatigue in antiferroelectrics is less sever
Externí odkaz:
http://arxiv.org/abs/1001.2963
Autor:
Lou, X. J., Wang, J.
Publikováno v:
Journal of Applied Physics, 108, 034104 (2010)
By performing standard PUND (positive-up-negative-down), hysteresis-loop and dielectric measurements on the ferroelectric lead zirconate titanate (PZT) thin-film capacitors subject to bipolar/unipolar electrical cycling, we show that unipolar fatigue
Externí odkaz:
http://arxiv.org/abs/0911.5009
Autor:
Lou, X. J., Wang, J.
We have investigated the size effect in lead zirconate titanate (PZT) thin films with a range of manganese (Mn) doping concentrations. We found that the size effect in the conventional Pt/PZT/Pt thin-film capacitors could be systematically reduced an
Externí odkaz:
http://arxiv.org/abs/0907.3528
Autor:
Lou, X. J.
Publikováno v:
Journal of Applied Physics 105, 094112 (2009)
We classify the switching kinetics of ferroelectrics including both epitaxial/polycrystalline thin films and single-crystalline/ceramic bulks at various applied fields into four categories, depending on whether the depolarization field and/or the pol
Externí odkaz:
http://arxiv.org/abs/0812.1437
Autor:
Lou, X. J.
Publikováno v:
Journal of Applied Physics 105, 094107 (2009)
We developed a model with no adjustable parameter for retention loss at short and long time scale in ferroelectric thin-film capacitors. We found that the predictions of this model are in good agreement with the experimental observations in the liter
Externí odkaz:
http://arxiv.org/abs/0812.0897
Autor:
Lou, X. J.
Publikováno v:
J. Phys.: Condens. Matter 21 (2009) 012207
By assuming a more realistic nucleation and polarization reversal scenario we build a new statistical switching model for ferroelectrics, which is different from either the Kolmogorov-Avrami-Ishibashi (KAI) model or the Nucleation-Limited-Switching (
Externí odkaz:
http://arxiv.org/abs/0807.2494
Publikováno v:
Applied Physics Letters, 90, 262908 (2007)
Micro-Raman studies show that under ~700 kV/cm of d.c. voltage stressing for a few seconds, thin-film bismuth ferrite BiFeO3 phase separates into magnetite Fe3O4. No evidence is found spectroscopically of hemite alpha-Fe2O3, maghemite gamma-Fe2O3, or
Externí odkaz:
http://arxiv.org/abs/cond-mat/0703388
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Akademický článek
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