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pro vyhledávání: '"Lotharukpong, C."'
Autor:
Lotharukpong, C., Tweddle, D., Martin, T.L., Wu, M., Grovenor, C.R.M., Moody, M.P., Wilshaw, P.R.
Publikováno v:
In Materials Characterization September 2017 131:472-479
Autor:
Lotharukpong, C
Electron beam induced current (EBIC) and atom probe tomography (APT) were used in this study to determine electrical activities and impurity compositions at extended defects in multicrystalline silicon (mc-Si) samples. The results provide, for the fi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1064::15b626182eec0ad36ebad47892b5fb4c
https://ora.ox.ac.uk/objects/uuid:a803fada-2296-41c3-9d96-864c186957a2
https://ora.ox.ac.uk/objects/uuid:a803fada-2296-41c3-9d96-864c186957a2
