Zobrazeno 1 - 10
of 343
pro vyhledávání: '"Lothar Strüder"'
Autor:
Stefano Maffessanti, Karsten Hansen, Stefan Aschauer, Andrea Castoldi, Florian Erdinger, Carlo Fiorini, Peter Fischer, Pradeep Kalavakuru, Helmut Klär, Massimo Manghisoni, Christian Reckleben, Lothar Strüder, Matteo Porro
Publikováno v:
Scientific Reports, Vol 13, Iss 1, Pp 1-12 (2023)
Abstract The 64k pixel DEPFET module is the key sensitive component of the DEPFET Sensor with Signal Compression (DSSC), a large area 2D hybrid detector for capturing and measuring soft X-rays at the European XFEL. The final 1-megapixel camera has to
Externí odkaz:
https://doaj.org/article/497f9217c4154a8db0b0764687895c73
Publikováno v:
Sensors, Vol 16, Iss 5, p 608 (2016)
Depleted field effect transistors (DEPFET) are used to achieve very low noise signal charge readout with sub-electron measurement precision. This is accomplished by repeatedly reading an identical charge, thereby suppressing not only the white serial
Externí odkaz:
https://doaj.org/article/5ebf6248bfb54d77a9a8748ca844dc5b
Autor:
Hazem Yousef, Karim Ahmed, Astrid Münnich, Tonn Rüter, Kiana Setoodehnia, Cyril Danilevski, Steffen Hauf, Rico Mayro P. Tanyag, Rüdiger Schmitt, Michael Meyer, Lothar Strüder, Marko Ž. Ekmedžić, Daniela Rupp, Jacobo Montaño, P. Gessler, Dieter Schlosser, Anatoli Ulmer, Peter Holl, Markus Kuster, Robert Hartmann, Nils Rennhack, Y. Ovcharenko, Bruno Fernandes, Kai Erik Ballak
Publikováno v:
Journal of Synchrotron Radiation
The X-ray free-electron lasers that became available during the last decade, like the European XFEL (EuXFEL), place high demands on their instrumentation. Especially at low photon energies below $1\,\text{keV}$, detectors with high sensitivity, and c
Autor:
Lothar Strüder, Robert Hartmann, Olivier P. Thomas, Thomas W. Cornelius, A. Abboud, Gunther Richter, Ali AlHassan, Ullrich Pietsch, Zhe Ren, S. Send, Jean-Sébastien Micha
Publikováno v:
'Journal of Applied Crystallography ', vol: 54, pages: 80-86 (2021)
Journal of Applied Crystallography
Journal of Applied Crystallography, 2021, 54, pp.80-86. ⟨10.1107/s1600576720014855⟩
Journal of Applied Crystallography, International Union of Crystallography, 2021, 54, pp.80-86. ⟨10.1107/s1600576720014855⟩
Journal of Applied Crystallography
Journal of Applied Crystallography, 2021, 54, pp.80-86. ⟨10.1107/s1600576720014855⟩
Journal of Applied Crystallography, International Union of Crystallography, 2021, 54, pp.80-86. ⟨10.1107/s1600576720014855⟩
This article reports on energy-dispersive micro Laue (µLaue) diffraction of an individual gold nanowire that was mechanically deformed in three-point bending geometry using an atomic force microscope. The nanowire deformation was investigated by sca
Publikováno v:
Microscopy Today. 28:46-53
In the 50 years since the first mating of semiconductor-based energy-dispersive X-ray spectrometry (EDS) with the scanning electron microscope (SEM), this hybrid instrument has become an indispensable microanalytical tool. In the last two decades a n
Publikováno v:
The WSPC Handbook of Astronomical Instrumentation
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::43100e237d1b544e80ed0591e2ff8c84
https://doi.org/10.1142/9789811203800_0009
https://doi.org/10.1142/9789811203800_0009
Autor:
Robert Andritschke, Christian Schmid, Joern Wilms, T. Mernik, Josef Eder, C. Tenzer, Mara Salvato, Lothar Strüder, Lars Tiedemann, Michael Freyberg, V. Arefiev, E. Churazov, V. Babyshkin, Esra Bulbul, Benjamin Mican, H. Scheuerle, Axel Schwope, Hermann Brunner, D. Coutinho, Georg Lamer, Jan Robrade, Miriam E. Ramos-Ceja, Heinrich Bräuninger, Elmar Pfeffermann, Kirpal Nandra, Peter Friedrich, Marcella Brusa, Tanja Eraerds, Joachim Trümper, I. Lomakin, I. Lapshov, Antonis Georgakakis, Joseph J. Mohr, W. Kink, A. Gueguen, Thomas H. Reiprich, Vadim Burwitz, Daniel Pietschner, Frank Haberl, N. Clerc, Jonas Reiffers, Ian M. Stewart, O. Batanov, Chandreyee Maitra, Katharina Borm, M. Buntov, V. Nazarov, Th. Boller, Alexis Finoguenov, Sebastian Müller, Emanuele Perinati, Matthias Steinmetz, A. Shirshakov, S. Friedrich, Valeri Yaroshenko, F. Korotkov, Peter Predehl, Andreas von Kienlin, P. Weber, Valentin Emberger, M. N. Pavlinsky, Florian Pacaud, W. Bornemann, Thomas Dauser, Marcus Brüggen, Norbert Meidinger, Gisela Hartner, Konrad Dennerl, A. V. Bogomolov, O. Hälker, P. Gureev, B. Menz, Wolfgang Burkert, Jeremy S. Sanders, Werner Becker, Andrea Merloni, Rashid Sunyaev, Long Ji, V. Voron, S. Granato, Maria Fürmetz, Manami Sasaki, Andrea Santangelo, Hans Böhringer, Guenther Hasinger, Arne Rau, Victor Doroshenko, H. Huber, Ingo Kreykenbohm, Tie Liu, Marat Gilfanov, Christoph Grossberger, Jürgen H. M. M. Schmitt
Publikováno v:
Astronomy and Astrophysics-A&A
Astronomy and Astrophysics-A&A, EDP Sciences, 2021, 647 (A1), ⟨10.1051/0004-6361/202039313⟩
Astronomy and Astrophysics-A&A, 2021, 647 (A1), ⟨10.1051/0004-6361/202039313⟩
Astronomy and Astrophysics-A&A, EDP Sciences, 2021, 647 (A1), ⟨10.1051/0004-6361/202039313⟩
Astronomy and Astrophysics-A&A, 2021, 647 (A1), ⟨10.1051/0004-6361/202039313⟩
eROSITA (extended ROentgen Survey with an Imaging Telescope Array) is the primary instrument on the Spectrum-Roentgen-Gamma (SRG) mission, which was successfully launched on July 13, 2019, from the Baikonour cosmodrome. After the commissioning of the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::63edd7c89c382b9ea64d3d73b56d88b3
https://hal.archives-ouvertes.fr/hal-02992197
https://hal.archives-ouvertes.fr/hal-02992197
Publikováno v:
Software and Cyberinfrastructure for Astronomy VI.
In a semiconductor tracking detector, a single X-ray photon can create signals in a cluster of adjacent pixels. We present a novel technique to reconstruct the points of entry (PoEs) of X-ray photons from these clusters based on a convolutional neura
Autor:
Oliver Blake, Jens Ormö, Raymond Fairbend, Tatsuaki Okada, HR Williams, Arto V. Luttinen, Juhani Huovelin, Petra Majewski, Emma J. Bunce, Martin Hilchenbach, Tuomo Tikkanen, Adrian Martindale, G. P. Hall, Katherine H. Joy, Corinne Barcelo-Garcia, Miguel Mas-Hesse, C. Feldman, Nathalie Vaudon, Jose Viceira-Martín, Ulrich R. Christensen, Ian A. Crawford, Chris Bicknell, Lothar Strüder, Andy Cheney, Suzanne M. Imber, Phil A. Bland, Maria Genzer, Tony Crawford, Timo Väisänen, Steve Milan, John Bridges, S. Nenonen, Nigel Bannister, Christopher Thomas, Arto Lehtolainen, Ana Balado Margeli, Rosie Hodnett, Esa Kallio, Jim Pearson, Konrad Dennerl, D. Ross, Emile Schyns, Simon Lindsay, Eero Esko, Paul Drumm, Miriam Pajas-Sanz, Eddy Robert, S. Korpela, Tomas Kohout, Ivor Mcdonnell, Maria Luisa Lara, Johannes Treis, Guilhem Alibert, Richard Poyner, Mahesh Anand, Manuel Grande, Maria Angeles Alcacera-Gil, Peter Millington-Hotze, Karri Muinonen, D. Willingale, Paul Houghton, Michele K. Dougherty, Larry R. Nittler, Antti Penttilä, Gillian Butcher, J. Thornhill, David A. Rothery, Sylvestre Maurice, Tim K. Yeoman, Julien Seguy, Juan Pérez-Mercader
Full list of authors: Bunce, Emma J.; Martindale, Adrian; Lindsay, Simon; Muinonen, Karri; Rothery, David A.; Pearson, Jim; McDonnell, Ivor; Thomas, Chris; Thornhill, Julian; Tikkanen, Tuomo; Feldman, Charly; Huovelin, Juhani; Korpela, Seppo; Esko, E
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b980f04fd493ca53b19369a46040d532
https://eprints.bbk.ac.uk/id/eprint/41395/1/41395.pdf
https://eprints.bbk.ac.uk/id/eprint/41395/1/41395.pdf
Autor:
S. Send, Lothar Strüder, Christoph Kirchlechner, Robert Hartmann, Jozef Keckes, T. Conka Nurdan, A. Abboud, Jean-Sébastien Micha, Olivier Ulrich, Ullrich Pietsch
Publikováno v:
'Journal of Applied Crystallography ', vol: 50, pages: 901-908 (2017)
Journal of Applied Crystallography
Journal of Applied Crystallography
By simultaneously measuring changes in energy and reflection angle of Laue spots with respect to a reference position, it is possible to measure all lattice parameters of a unit cell and calculate the full strain/stress tensors in a single-shot exper