Characterization testing of dual junction GaInP/sub 2//GaAs/Ge solar cell assemblies.

Autor: Brown, M.R., Goldhammer, L.J., Goodelle, G.S., Lortz, C.U., Perron, J.N., Powe, J.S., Schwartz, J.A., Cavicchi, B.T., Gillanders, M.S., Krut, D.D.

Publikováno v: Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997; 1997, p805-810, 6p