Zobrazeno 1 - 1
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pro vyhledávání: '"Look Up Table Model (LUT)"'
Autor:
Ajayan, K R
Process variability is a major challenge for the design of nano scale MOSFETs due to fundamental physical limits as well as process control limitations. As the size of the devices is scales down to improve performance, the circuit becomes more sensit
Externí odkaz:
http://etd.iisc.ernet.in/2005/3516
http://etd.iisc.ernet.in/abstracts/4383/G26726-Abs.pdf
http://etd.iisc.ernet.in/abstracts/4383/G26726-Abs.pdf
