Výsledky vyhledávání - "Longstaff, Christopher"

Conference

Minimizing wafer defectivity during high-temperature baking of organic films in 193nm lithography.

Autor: Randall, Mai, Longstaff, Christopher, Ueda, Kenichi, Nicholson, Jim, Winter, Thomas

Publikováno v: Proceedings of SPIE; Nov2006 Part 2, Issue 1, p61530V-61530V-9, 9p

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Conference

Use of direct washing of chemical dispense nozzle for defect control.

Autor: Linnane, Michael, Mack, George, Longstaff, Christopher, Winter, Thomas

Publikováno v: Proceedings of SPIE; Nov2006 Part 2, Issue 1, p61533D-61533D-9, 9p

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Periodical

Channel-containing 1D coordination polymers based on a linear dimetallic spacer

Autor: Belcher, Warwick J., Longstaff, Christopher A., Neckenig, Marcus R., Steed, Jonathan W.

Publikováno v: Chemical Communications; July 11, 2002, Vol. 2002 Issue: 15 p1602-1603, 2p

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