High-throughput determination of grain size distributions by EBSD with low-discrepancy sampling.

Autor: Long TJH; Hopkins Extreme Materials Institute, Johns Hopkins University, Baltimore, Maryland, USA., Holbrook W; Department of Materials Science and Engineering, Johns Hopkins University, Baltimore, Maryland, USA., Hufnagel TC; Hopkins Extreme Materials Institute, Johns Hopkins University, Baltimore, Maryland, USA.; Department of Materials Science and Engineering, Johns Hopkins University, Baltimore, Maryland, USA., Mueller T; Hopkins Extreme Materials Institute, Johns Hopkins University, Baltimore, Maryland, USA.; Department of Materials Science and Engineering, Johns Hopkins University, Baltimore, Maryland, USA.

Publikováno v: Journal of microscopy [J Microsc] 2024 Jan; Vol. 293 (1), pp. 20-37. Date of Electronic Publication: 2023 Dec 18.