Using machine learning to detect rotational and local reflectional symmetries in 2D images

Autor: Ponse, K., Kononova, A.V., Loleyt, M., Stein, B. van

Publikováno v: 2021 IEEE Symposium Series on Computational Intelligence (SSCI) Proceedings, 01-08. Orlando, Florida: IEEE
STARTPAGE=01;ENDPAGE=08;TITLE=2021 IEEE Symposium Series on Computational Intelligence (SSCI) Proceedings

Automated symmetry detection is still a difficult task in 2021. However, it has applications in computer vision, and it also plays an important part in understanding art. This paper focuses on aiding the latter by comparing different state-of-the-art

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::aaec2b72521ea4e1d7cc89634186c358
https://ieeexplore.ieee.org/document/9660120