Application of Test-View Modeling to Hierarchical ATPG.

Autor: Shukla, Rahul, Loi, Phong, Pham, Ken, Margulis, Arie, Yang, Kathy, Tamarapalli, Nagesh

Publikováno v: 2014 27th International Conference on VLSI Design & 2014 13th International Conference on Embedded Systems; 2014, p110-115, 6p