Zobrazeno 1 - 10
of 591
pro vyhledávání: '"Loh, N"'
We present a method using Zernike moments for quantifying rotational and reflectional symmetries in scanning transmission electron microscopy (STEM) images, aimed at improving structural analysis of materials at the atomic scale. This technique is ef
Externí odkaz:
http://arxiv.org/abs/2405.17519
Autor:
Shen, Zhou, Awel, Salah, Barty, Anton, Bean, Richard, Bielecki, Johan, Bergemann, Martin, Daurer, Benedikt J., Ekeberg, Tomas, Estillore, Armando D., Fangohr, Hans, Giewekemeyer, Klaus, Hunter, Mark S., Karnevskiy, Mikhail, Kirian, Richard A., Kirkwood, Henry, Kim, Yoonhee, Koliyadu, Jayanath, Lange, Holger, Letrun, Romain, Lübke, Jannik, Mall, Abhishek, Michelat, Thomas, Morgan, Andrew J., Roth, Nils, Samanta, Amit K., Sato, Tokushi, Sikorski, Marcin, Schulz, Florian, Vagovic, Patrik, Wollweber, Tamme, Worbs, Lena, Xavier, Paul Lourdu, Maia, Filipe R. N. C., Horke, Daniel A., Küpper, Jochen, Mancuso, Adrian P., Chapman, Henry N., Ayyer, Kartik, Loh, N. Duane
Nanoparticles, exhibiting functionally relevant structural heterogeneity, are at the forefront of cutting-edge research. Now, high-throughput single-particle imaging (SPI) with x-ray free-electron lasers (XFELs) creates unprecedented opportunities fo
Externí odkaz:
http://arxiv.org/abs/2401.04896
Autor:
Yeo, Joel, Daurer, Benedikt J., Kimanius, Dari, Balakrishnan, Deepan, Bepler, Tristan, Tan, Yong Zi, Loh, N. Duane
Ewald sphere curvature correction, which extends beyond the projection approximation, stretches the shallow depth of field in cryo-EM reconstructions of thick particles. Here we show that even for previously assumed thin particles, reconstruction art
Externí odkaz:
http://arxiv.org/abs/2312.08965
Autor:
Baranikov, Anton V., Khaidarov, Egor, Lassalle, Emmanuel, Eschimese, Damien, Yeo, Joel, Loh, N. Duane, Paniagua-Dominguez, Ramon, Kuznetsov, Arseniy I.
Metalenses, in order to compete with conventional bulk optics in commercial imaging systems, often require large field of view (FOV) and broadband operation simultaneously. However, strong chromatic and coma aberrations present in common metalens des
Externí odkaz:
http://arxiv.org/abs/2305.16676
Autor:
Balakrishnan, Deepan, Prakash, Anupama, Daurer, Benedikt J., Finet, Cédric, Lim, Ying Chen, Shen, Zhou, Thibault, Pierre, Monteiro, Antónia, Loh, N. Duane
How pigment distribution correlates with cuticle density within a microscopic butterfly wing scale, and how both impact final reflected color remains unknown. We used ptychographic X-ray computed tomography to quantitatively determine, at nanoscale r
Externí odkaz:
http://arxiv.org/abs/2305.16628
Autor:
Dan, Jiadong, Waqar, Moaz, Erofeev, Ivan, Yao, Kui, Wang, John, Pennycook, Stephen J., Loh, N. Duane
A continuing challenge in atomic resolution microscopy is to identify significant structural motifs and their assembly rules in synthesized materials with limited observations. Here we propose and validate a simple and effective hybrid generative mod
Externí odkaz:
http://arxiv.org/abs/2305.18325
Autor:
Balakrishnan, Deepan, Chee, See Wee, Baraissov, Zhaslan, Bosman, Michel, Mirsaidov, Utkur, Loh, N. Duane
Three-dimensional (3D) imaging of thin, extended specimens at nanometer resolution is critical for applications in biology, materials science, advanced synthesis, and manufacturing. One route to 3D imaging is tomography, which requires a tilt series
Externí odkaz:
http://arxiv.org/abs/2209.07930
Autor:
Yeo, Joel, Daurer, Benedikt J., Kimanius, Dari, Balakrishnan, Deepan, Bepler, Tristan, Tan, Yong Zi, Loh, N. Duane
Publikováno v:
In Ultramicroscopy August 2024 262
Autor:
Zhuang, Yulong, Awel, Salah, Barty, Anton, Bean, Richard, Bielecki, Johan, Bergemann, Martin, Daurer, Benedikt J., Ekeberg, Tomas, Estillore, Armando D., Fangohr, Hans, Giewekemeyer, Klaus, Hunter, Mark S., Karnevskiy, Mikhail, Kirian, Richard A., Kirkwood, Henry, Kim, Yoonhee, Koliyadu, Jayanath, Lange, Holger, Letrun, Romain, Lübke, Jannik, Mall, Abhishek, Michelat, Thomas, Morgan, Andrew J., Roth, Nils, Samanta, Amit K., Sato, Tokushi, Shen, Zhou, Sikorski, Marcin, Schulz, Florian, Spence, John C. H., Vagovic, Patrik, Wollweber, Tamme, Worbs, Lena, Xavier, P. Lourdu, Yefanov, Oleksandr, Maia, Filipe R. N. C., Horke, Daniel A., Küpper, Jochen, Loh, N. Duane, Mancuso, Adrian P., Chapman, Henry N., Ayyer, Kartik
One of the outstanding analytical problems in X-ray single particle imaging (SPI) is the classification of structural heterogeneity, which is especially difficult given the low signal-to-noise ratios of individual patterns and that even identical obj
Externí odkaz:
http://arxiv.org/abs/2109.06179
Autor:
Daurer, Benedikt J., Sala, Simone, Hantke, Max F., Reddy, Hemanth K. N., Bielecki, Johan, Shen, Zhou, Nettleblad, Carl, Svenda, Martin, Ekeberg, Tomas, Carini, Gabriella A., Hart, Philip, Osipov, Timur, Aquila, Andrew, Loh, N. Duane, Maia, Filipe R. N. C., Thibault, Pierre
A well-characterised wavefront is important for many X-ray free-electron laser (XFEL) experiments, especially for single-particle imaging (SPI), where individual bio-molecules randomly sample a nanometer-region of highly-focused femtosecond pulses. W
Externí odkaz:
http://arxiv.org/abs/2012.13783