Zobrazeno 1 - 10
of 18
pro vyhledávání: '"Lloyd W. Irwin"'
Autor:
Kenneth A. Peterson, Samuel L. Miller, Lloyd W. Irwin, Danelle M. Tanner, Norman F. Smith, William P. Eaton, Paiboon Tangyunyong, William M. Miller, D.C. Senft, Michael T. Dugger
Publikováno v:
Microelectronics Reliability. 39:401-414
Experiments have been performed on surface micromachined microengines driving load gears to determine the rotational frequency dependence on median cycles to failure. A sample of 272 microengines, each driving a load, was stressed at eight different
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::82d146df3ae908ff3dddf1133ab0cabd
https://doi.org/10.1016/s0026-2714(98)00248-0
https://doi.org/10.1016/s0026-2714(98)00248-0
Autor:
Norman F. Smith, Michael T. Dugger, Samuel L. Miller, Jeremy A. Walraven, Lloyd W. Irwin, William M. Miller, William P. Eaton, Danelle M. Tanner
Publikováno v:
1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296).
Humidity is shown to be a strong factor in the wear of rubbing surfaces in polysilicon micromachines. We demonstrate that very low humidity can lead to very high wear without a significant change in reliability. We show that the volume of wear debris
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::05de055cf24d5b6a98dee3d17f33106a
https://doi.org/10.1109/relphy.1999.761611
https://doi.org/10.1109/relphy.1999.761611
Autor:
J.R. Stake, Karen Sue Helgesen, Danelle M. Tanner, D.L. Gregory, Lloyd W. Irwin, Jeremy A. Walraven, Norman F. Smith
Publikováno v:
2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059).
MicroElectroMechanical Systems (MEMS) were subjected to a vibration environment that had a peak acceleration of 120 g and spanned frequencies from 20 to 2000 Hz. The device chosen for this test was a surface-micromachined microengine because it posse
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ccd18ec6ddb369290dd26f88d2a48f9a
https://doi.org/10.1109/relphy.2000.843904
https://doi.org/10.1109/relphy.2000.843904
Autor:
Jerome F. Jakubczak, Michael T. Dugger, Danelle M. Tanner, Jeremy A. Walraven, David A. LaVan, S. S. Mani, Lloyd W. Irwin, Jeffry J. Sniegowski, M.P. se Beer, James G. Fleming, William M. Miller
Publikováno v:
2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059).
Two major problems associated with Si-based MEMS (MicroElectroMechanical Systems) devices are stiction and wear. Surface modifications are needed to reduce both adhesion and friction in micromechanical structures to solve these problems. In this pape
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e299552c3770655453ed54328b80b099
https://doi.org/10.1109/relphy.2000.843905
https://doi.org/10.1109/relphy.2000.843905
Autor:
Lloyd W. Irwin, F. Brown, Karen Sue Helgesen, Jeremy A. Walraven, N. Masters, Danelle M. Tanner, Norman F. Smith
Publikováno v:
2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059).
In order to determine the susceptibility of our MEMS (MicroElectroMechanical Systems) devices to shock, tests were performed using haversine shock pulses with widths of 1 to 0.2 ms in the range from 500 g to 40000 g. We chose a surface-micromachined
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6c6352bb23f6ea3c54fc69fe82cfc470
https://doi.org/10.1109/relphy.2000.843903
https://doi.org/10.1109/relphy.2000.843903
Autor:
Jeremy A. Walraven, R.E. Anderson, Lloyd W. Irwin, Edward I. Cole, Danelle M. Tanner, Paiboon Tangyunyong, Jerry M. Soden
Publikováno v:
SPIE Proceedings.
Electrostatic discharge (ESD) and electrical overstress (EOS) damage of Micro-Electrical-Mechanical Systems (MEMS) has been identified as a new failure mode. This failure mode has not been previously recognized or addressed primarily due to the mecha
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6b0143f991a1d02d14503138c577120e
https://doi.org/10.1117/12.395703
https://doi.org/10.1117/12.395703
Autor:
Karen Sue Helgesen, Norman F. Smith, William M. Miller, Jeremy A. Walraven, Lloyd W. Irwin, William P. Eaton, Samuel L. Miller, Kenneth A. Peterson, Michael T. Dugger, Danelle M. Tanner, J. Joseph Clement
The burgeoning new technology of Micro-Electro-Mechanical Systems (MEMS) shows great promise in the weapons arena. We can now conceive of micro-gyros, micro-surety systems, and micro-navigators that are extremely small and inexpensive. Do we want to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::215d9e2f9765aceb49c6dcd6475ea580
https://doi.org/10.2172/750344
https://doi.org/10.2172/750344
Autor:
Siv Limary, Harold D. Stewart, Lloyd W. Irwin, Jerome F. Jakubczak, James H. Smith, Stephen Montague, Jeffry J. Sniegowski, Maarten P. de Boer, John McBrayer
Publikováno v:
SPIE Proceedings.
SUMMiT (Sandia Ultra-planar Multi-level MEMS Technology) at the Sandia National Laboratories' MDL (Microelectronics Development Laboratory) is a standardized MEMS (Microelectromechanical Systems) technology that allows designers to fabricate concept
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b44fb7d1c214e59d9c03ed716d9799ea
https://doi.org/10.1117/12.361210
https://doi.org/10.1117/12.361210
Autor:
Jeremy A. Walraven, M.P. de Boer, Lloyd W. Irwin, D. A. La Van, Jeffry J. Sniegowski, S. S. Mani, Danelle M. Tanner, James G. Fleming
Publikováno v:
MRS Proceedings. 605
Two major problems associated with Si-based MEMS (MicroElectroMechanical Systems) devices are stiction and wear. Surface modifications are needed to reduce both adhesion and friction in micromechanical structures to solve these problems. In this pape
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3afcdb8246cb8ee369e285c7494de862
https://doi.org/10.1557/proc-605-135
https://doi.org/10.1557/proc-605-135
Autor:
Norman F. Smith, Paiboon Tangyunyong, Danelle M. Tanner, William M. Miller, Kenneth A. Peterson, Lloyd W. Irwin, William P. Eaton, M. Steven Rodgers
Publikováno v:
SPIE Proceedings.
The reliability of microengines is a function of the design of the mechanical linkage used to connect the electrostatic actuator to the drive. The authors have completed a series of reliability stress tests on surface micromachined microengines drivi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f5d5df0adcb2adfcea511b6a8cc3a8da
https://doi.org/10.1117/12.324060
https://doi.org/10.1117/12.324060