Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Lloyd F. Arrowood"'
Autor:
Kenneth W. Tobin, Thomas P. Karnowski, Lloyd F. Arrowood, Regina K. Ferrell, Fred Lakhani, James S. Goddard
Publikováno v:
EURASIP Journal on Advances in Signal Processing, Vol 2002, Iss 7, Pp 704-713 (2002)
Image data management in the semiconductor manufacturing environment is becoming more problematic as the size of silicon wafers continues to increase, while the dimension of critical features continues to shrink. Fabricators rely on a growing host of
Externí odkaz:
https://doaj.org/article/2775202573b14e2fb585e7a44816281b
Autor:
Chao Yang, Padma Raghavan, Robert E. Tuzun, Donald W. Noid, Lloyd F. Arrowood, Bobby G. Sumpter
Publikováno v:
The International Journal of High Performance Computing Applications. 16:409-424
Summary A parallel computational scheme for analyzing large-scale molecular vibration on distributed memory computing platforms is presented in this paper. This method combines the implicitly restarted Lanczos algorithm with a state-of-art parallel s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f978889932560d06d6fd6a7c6a5960a0
https://doi.org/10.1177/109434200201600404
https://doi.org/10.1177/109434200201600404
Autor:
Fred Lakhani, Regina K. Ferrell, Thomas P. Karnowski, Lloyd F. Arrowood, Kenneth W. Tobin, James S. Goddard
Publikováno v:
EURASIP Journal on Advances in Signal Processing, Vol 2002, Iss 7, Pp 704-713 (2002)
Image data management in the semiconductor manufacturing environment is becoming more problematic as the size of silicon wafers continues to increase, while the dimension of critical features continues to shrink. Fabricators rely on a growing host of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::087611af4340f1abeff0a0be2f3ca40d
https://doaj.org/article/2775202573b14e2fb585e7a44816281b
https://doaj.org/article/2775202573b14e2fb585e7a44816281b
Autor:
Ming Jiang, Lloyd F. Arrowood, Raju Vatsavai, Thrasyvoulos N. Pappas, Alex Sorokine, Lucinda R. Gaines, Anil Cheriyadat, Randy S. Roberts, Lawrence K. Chilton, Timothy G. Trucano, Aggelos K. Katsaggelos, Paul A. Pope, Shaun S. Gleason
Publikováno v:
IGARSS
The design of benchmark imagery for validation of image annotation algorithms is considered. Emphasis is placed on imagery that contains industrial facilities, such as chemical refineries. An application-level facility ontology is used as a means to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::91de2c1735e41c4c654d53eb0bed9448
https://doi.org/10.1109/igarss.2011.6049340
https://doi.org/10.1109/igarss.2011.6049340
Autor:
Aggelos K. Katsaggelos, Ranga Raju Vatsavai, Anil Cheriyadat, Reid B. Porter, Carl F. Diegert, Ryan E. Hohimer, Barry Chen, Eddie A Bright, James S. Bollinger, Lloyd F. Arrowood, Budhendra L. Bhaduri, Shaun S. Gleason, Thrasos Pappas
Publikováno v:
IGARSS
With increasing understanding and availability of nuclear technologies, and increasing persuasion of nuclear technologies by several new countries, it is increasingly becoming important to monitor the nuclear proliferation activities. There is a grea
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::766ee51987f0ae1159f35ccb1ddea33d
https://doi.org/10.1109/igarss.2010.5649811
https://doi.org/10.1109/igarss.2010.5649811
Publikováno v:
2001 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (IEEE Cat. No.01CH37160).
The rapid identification of yield detracting mechanisms through integrated yield management is the primary goal of defect sourcing and yield learning. At future technology nodes, yield learning must proceed at an accelerated rate to maintain current
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dc11a6e50ab9b5839727bd6234778183
https://doi.org/10.1109/asmc.2001.925642
https://doi.org/10.1109/asmc.2001.925642
Autor:
Thomas P. Karnowski, Fred Lakhani, James S. Goddard, Kenneth W. Tobin, Lloyd F. Arrowood, Regina K. Ferrell
Publikováno v:
SPIE Proceedings.
Images of semiconductor defects are maintained in semiconductor yield management systems to diagnose problems that arise during the manufacturing process. A semiconductor-specific content-based image retrieval system was developed by Oak Ridge Nation
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fc375677b9acbba7a3ccfa2daeae8037
https://doi.org/10.1117/12.429362
https://doi.org/10.1117/12.429362
Publikováno v:
Risk Assessment in Setting National Priorities ISBN: 9781468456844
An interactive computer program developed at Oak Ridge National Laboratory is presented as a methodology to model individualized belief structures. The logic and general strategy of the model are presented for two risk topics: AIDS and toxic waste. S
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c42220b396754f847ae75857475a819b
https://doi.org/10.1007/978-1-4684-5682-0_46
https://doi.org/10.1007/978-1-4684-5682-0_46
Publikováno v:
Computers & Security. 7:509-510
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ec0fe20eb9c5f2150575d5a0f1623192
https://doi.org/10.1016/0167-4048(88)90208-8
https://doi.org/10.1016/0167-4048(88)90208-8
Conference
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