Zobrazeno 1 - 10
of 31
pro vyhledávání: '"Liu De-Wei"'
Publikováno v:
In Applied Surface Science 30 November 2023 638
Autor:
Wang, Ling Li, Zhao, Cheng Zhou, Kang, Li Ping, Liu, De Wei, Zhao, Hui Chun, Hao, Shan Peng, Zhang, Yuan Kai, Chen, Zhen Ping, Li, Xin Jian
Publikováno v:
In Applied Surface Science 30 October 2016 384:530-533
Publikováno v:
In Journal of Alloys and Compounds 15 October 2016 682:170-175
Akademický článek
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Autor:
Liu, De-Wei, 劉德蔚
105
Two experiments were conducted to evaluate the effects of partial replacement of fish meal protein by dry maggot meal (DMM) and frozen maggot (FM) on the growth performances and moulting frequency of white shrimp, Litopenaeus vannamei. In ex
Two experiments were conducted to evaluate the effects of partial replacement of fish meal protein by dry maggot meal (DMM) and frozen maggot (FM) on the growth performances and moulting frequency of white shrimp, Litopenaeus vannamei. In ex
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/ch4wb5
Autor:
Liu, De-Wei, 劉德緯
104
Copper indium gallium selenide (CIGS) is one of the most suitable materials for thin-film photovoltaic devices, due to highly efficient, low-cost thin film solar cells, and the commercial production of CIGS films is growing rapidly. The vary
Copper indium gallium selenide (CIGS) is one of the most suitable materials for thin-film photovoltaic devices, due to highly efficient, low-cost thin film solar cells, and the commercial production of CIGS films is growing rapidly. The vary
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/13850797683563388978
Akademický článek
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Publikováno v:
Journal of Semiconductors. 34:063001
Pn junctions based on single crystalline tellurium supersaturated silicon were formed by ion implantation followed by pulsed laser melting (PLM). P type silicon wafers were implanted with 245 keV 126Te+ to a dose of 2 × 1015 ions/cm2, after a PLM pr
Publikováno v:
Chinese Physics Letters. 30:036101
Single crystalline silicon supersaturated with tellurium are formed by ion implantation followed by excimer nanosecond pulsed laser melting (PLM). The lattice damaged by ion implantation is restored during the PLM process, and dopants are effectively
Autor:
Liu, De Wei, Li, Tao, Dai, Hai Yang, Xue, Ren Zhong, Chen, Zhen Ping, Cao, Xing Zhong, Wang, Bao Yi
Publikováno v:
Diffusion and Defect Data Part A: Defect and Diffusion Forum; March 2017, Vol. 373 Issue: 1 p217-220, 4p